A method and device for determining quality level for index of island microgrid

A technology for index determination and quality level, applied in data processing applications, complex mathematical operations, instruments, etc., can solve problems such as unproposed solutions, achieve scientific evaluation process, reasonable and comprehensive index system structure

Pending Publication Date: 2021-02-09
STATE GRID SHANGHAI ENERGY INTERCONNECTION RES INST CO LTD +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Aiming at the technical problem of how to use the indicators of the island microgrid to determine the quality level of the island microgrid in the above-mentioned prior art, no effective solution has been proposed so far

Method used

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  • A method and device for determining quality level for index of island microgrid
  • A method and device for determining quality level for index of island microgrid
  • A method and device for determining quality level for index of island microgrid

Examples

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Embodiment 1

[0021] According to this embodiment, an embodiment of a method for determining the quality level of an index of a sea-island microgrid is also provided. It should be noted that the steps shown in the flow chart of the accompanying drawing can be executed in a set of computer-executable instructions such as and, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0022] The method embodiments provided in this embodiment can be executed in a server or similar computing devices. figure 1 A block diagram of a hardware structure of a computing device for implementing a method for determining a quality level for an index of a sea-island microgrid is shown. Such as figure 1 As shown, the computing device may include one or more processors (processors may include but not limited to processing devices such as microprocessors MCUs or programmable logic devices FPGAs...

Embodiment 2

[0091] Figure 6 A device 600 for determining a quality level for an index of a sea-island microgrid according to this embodiment is shown, and the device 600 corresponds to the method according to the first aspect of Embodiment 1. refer to Figure 6 As shown, the device 600 includes: an acquisition parameter module 610, which is used to obtain multiple operating parameters related to the indicators of the island microgrid; a determination indicator module 620, which is used to determine the index system of the island microgrid according to the operating parameters; A second weight module 630, used to determine the first weight for the index of the island microgrid through the first weighting method, and determine the second weight for the index of the island microgrid through the second weighting method for the index of the island microgrid. Weight; determine the comprehensive weight module 640, used to determine the comprehensive weight of the index system of the island mic...

Embodiment 3

[0104] Figure 7 A device 700 for determining a quality level for an index of a sea-island microgrid according to this embodiment is shown, and the device 700 corresponds to the method according to the first aspect of Embodiment 1. refer to Figure 7 As shown, the device 700 includes: a processor 710; and a memory 720, connected to the processor 710, for providing the processor 710 with instructions for processing the following processing steps: obtaining multiple operating parameters related to the index of the island microgrid; According to the operating parameters, the index system of the island microgrid is determined; for the index of the island microgrid, the first weight is determined for the index of the island microgrid through the first weighting method, and the index of the island microgrid is determined through the second weighting method determining the second weight; determining the comprehensive weight of the indicator system of the island microgrid according t...

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Abstract

The invention discloses a method and a device for determining a quality level for an index of an island microgrid. The method comprises the following steps: acquiring a plurality of operating parameters related to indexes of the island microgrid; determining an index system of the island microgrid according to the operation parameters; for the indexes of the island microgrid, determining a first weight for the indexes of the island microgrid through a first weighting method, and determining a second weight for the indexes of the island microgrid through a second weighting method; determining acomprehensive weight of an index system of the island microgrid according to the first weight and the second weight; and determining the quality level of the island microgrid according to the comprehensive weight of the indexes of the island microgrid.

Description

technical field [0001] The present application relates to the technical field of power system microgrids, in particular to a method and device for determining quality levels for indicators of island microgrids. Background technique [0002] Island microgrid is an effective way to solve the power supply demand of islands, and there are many island groups in the southeastern sea area of ​​my country. The application of island microgrid system is an ideal way to solve the power supply and distribution problems of island groups. At present, the research on microgrids mainly focuses on inland microgrids or independent island microgrids, and does not start from the source and load characteristics of each island in the archipelago to carry out research on the rationality evaluation of island microgrid planning schemes. How to use the indicators of the island microgrid to determine the quality level of the island microgrid becomes a necessity. [0003] For the technical problem of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F17/16G06F17/18G06Q50/06
CPCG06F17/16G06F17/18G06Q10/06395G06Q50/06
Inventor 季宇牛耕吴鸣寇凌峰丁保迪屈小云张颖庞成明熊雄刘晓娟孙树敏于芃
Owner STATE GRID SHANGHAI ENERGY INTERCONNECTION RES INST CO LTD
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