Detection method and system based on performance data of electronic component

Abstract

The invention provides a detection method and system based on electronic component performance data, and relates to the technical field of data processing. The method comprises the following steps: performing analysis processing on multiple groups of performance detection data obtained by performing performance detection processing on multiple to-be-detected electronic components for multiple times by an obtained performance detection device to obtain an analysis result of whether the performance of each electronic component is abnormal or not; for each electronic component, determining a group of performance detection data corresponding to the electronic component as the type of a training sample based on the analysis result corresponding to the electronic component; and training a pre-constructed neural network model based on the obtained multiple groups of performance detection data respectively serving as the positive training sample and the negative training sample to obtain a corresponding electronic component performance detection model. The performance detection data is processed by adopting the steps, so that the detection precision of whether the performance of the electronic component is abnormal or not can be improved.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a detection method and system based on performance data of electronic components. Background technique [0002] On the production side of electronic components, the performance of electronic components is generally tested after the production of electronic components is completed and before they are put into the market to determine whether there is any abnormality in the performance of electronic components. For example, the corresponding electronic components can be destroyed when abnormal. Components or re-improvement, etc. [0003] Therefore, the results of the performance test of the electronic components need to have higher precision. However, the inventors have found through research that in the prior art, it is generally based on simple analysis of the detection data of the electronic components themselves, such as threshold comparison, etc., to determine whether ...

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Problems solved by technology

However, the inventors have found through research that in the prior art, it is generally based on simple analysis of the detection data of the electronic components themselves, such as threshold comparison, etc., to determine whether the performance of the electronic equipment is abnormal. The problem of low accuracy of equipment performance detection

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