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Method for spectrometer, spectrometer system and storage medium

A technology of measuring device and measuring system, applied in spectrometry/spectrophotometry/monochromator, measuring device, radiation pyrometry, etc., can solve the problem that the same pattern cannot be obtained, the positioning of multiple spectroscopic images cannot be question

Pending Publication Date: 2022-06-24
SEIKO EPSON CORP
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  • Application Information

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Problems solved by technology

[0004] However, there are cases where the same pattern cannot be obtained in the reference image and the positioning image, and there is a problem that the positioning of a plurality of spectral images cannot be performed.

Method used

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  • Method for spectrometer, spectrometer system and storage medium
  • Method for spectrometer, spectrometer system and storage medium
  • Method for spectrometer, spectrometer system and storage medium

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Embodiment Construction

[0023] First, refer to figure 1 The configuration of the spectroscopic measurement system 1 will be described.

[0024] The spectroscopic measurement system 1 includes a spectroscopic measurement device 2 and a terminal device 7, and is configured to be able to communicate with each other. The spectroscopic measurement system 1 measures the measurement target light (incident light) from the measurement object X, which is the target object, and outputs the measurement result. The measurement object X is, for example, an image printed on a medium such as paper by a printing device or an image displayed on a display such as a liquid crystal panel, and is not limited to an image but may be a surface of an object or the like.

[0025] The spectroscopic measurement device 2 captures an image of the measurement object X and acquires a spectroscopic image 200 (refer to Image 6 ), including: an optical sensor unit 3 that captures the measurement target light from the measurement tar...

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Abstract

The invention provides a method for a spectroscopic measurement device, a spectroscopic measurement system, and a storage medium, which can suppress the influence of a shift even when the relative position of the spectroscopic measurement device and a measurement object is shifted when a plurality of spectroscopic images are acquired. The method includes: a first step of specifying a common feature point between a first spectroscopic image and at least one second spectroscopic image other than the first spectroscopic image among the plurality of spectroscopic images acquired by the spectroscopic element; a second step of detecting a relative positional misalignment amount between the first spectroscopic image and the second spectroscopic image; and a third step of performing positioning between the first spectroscopic image and the second spectroscopic image according to the detected relative positional misalignment amount, the positioning performed in the third step including correcting the position of the second spectroscopic image with respect to the position of the first spectroscopic image according to the common feature point.

Description

technical field [0001] The present invention relates to a spectrometry method, a spectrometry system and a computer program. Background technique [0002] For example, Patent Document 1 discloses a technique of acquiring a plurality of spectroscopic images using a spectrometry device, and calculating spectral data at a desired position. For example, as a method of positioning a plurality of spectroscopic images, it is performed by extracting the same pattern of the reference image and the positioning image to be positioned. [0003] Patent Document 1: Japanese Patent Laid-Open No. 2014-173919 [0004] However, there are cases in which the same pattern cannot be obtained in the reference image and the alignment image, and there is a problem that alignment of a plurality of spectroscopic images cannot be performed. SUMMARY OF THE INVENTION [0005] A method for a spectroscopic measurement device, characterized in that the spectroscopic measurement device includes: a spectr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/26G01J3/28G01J3/02
CPCG01J3/26G01J3/28G01J3/0208G01J2003/1265G06V10/58G06T7/33G06T2207/10016G06T2207/30148G01J3/2823G01J3/0264G01J3/027G01J3/0283G01J3/10G06T2207/10152G06T7/73G06T7/37
Inventor 广久保望
Owner SEIKO EPSON CORP
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