Method and apparatus for making and using wireless test verbs

Abstract

A computerized method and system for testing a function of an information-processing system. This includes providing an architecture having a set of test commands, the test commands including a set of one or more stimulation commands and a set of one or more result-testing commands, and defining a set of test verbs out of combinations of the test commands. This allows the test programmer to define an overall test program that uses the test verbs in writing a test program that specifies an overall function that will extensively test a system-under-test. The methods further includes executing a program that includes a plurality of test verb instructions and outputting a result of the program. In some embodiments, the present invention provides a computer-readable media that includes instructions coded thereon that when executed on a suitably programmed computer executes one or more of the above methods.

Description

RELATED APPLICATION [0001] This application claims priority to U.S. Provisional Application Ser. No. 60 / 377,515(entitled AUTOMATIC TESTING APPARATUS AND METHOD, filed May 1, 2002) which is herein incorporated by reference. [0002] This application is related to U.S. patent application entitled METHOD AND APPARATUS FOR MAKING AND USING TEST VERBS filed on even date herewith, to U.S. patent application entitled NON-INTRUSIVE TESTING SYSTEM AND METHOD filed on even date herewith, and to U.S. patent application entitled SOFTWARE TEST AGENTS filed on even date herewith, each of which are incorporated in their entirety by reference.FIELD OF THE INVENTION [0003] This invention relates to the field of computerized test systems and more specifically to a method and apparatus of making and using wireless test verbs out of combinations of simpler test commands. BACKGROUND OF THE INVENTION [0004] Wireless information-processing devices are tested several times over the course of their life cycle...

AI Technical Summary

Problems solved by technology

Additionally, the testing of such wireless information-processing devices is becoming more complex and time consuming because a wireless information-processing device may run on many different platforms with many different configurations in many different languages.

Because the series of steps is intended to both thoroughly exercise product functions as well as reexecute scenarios that have identified problems in the past, the testing process can be rather lengthy and time-consuming.

Add on the multiplicity of tests that must be executed due to device size, platform and configuration requirements, and language requirements, testing has become a time consuming and extremely expensive process.

In today's economy, manufacturers of technology solutions are facing new competitive pressures that are forcing them to change the way they bring products to market.

Manual testing procedures, long viewed as the only way to uncover product defects, effectively delay delivery of new products to the market, and the expense involved puts tremendous pressure on profitability margins.

Additionally, by their nature, manual testing procedures often fail to uncover all defects.

However, an effective automated testing product often cannot be implemented.

The most common reason for failure is the cost of creating and maintaining automated testing code.

Additionally, the available automated testing products are typically are a one size fits all type of product -that is not tailored to one specific type of device.

The creation of test automation scripts requires a considerable amount of time and resources.

Customizing a one size fits all product to a specific type of device also requires a considerable amount of time and resources.

The prior art is also lacking an automated testing system and method that meets the reusability deficiency that is also tailored to meet the automated testing needs of the wireless information-process device manufacturing and development community.

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