Curved top-plate edges spread the electric field, raising breakdown voltage while preserving capacitance in high-voltage isolation.
A SiAlOx leakage-reducing layer enables thin dielectric capacitor stacks to maintain capacitance density while suppressing leakage current.
Auxiliary electrode layers and via conductors reinforce thin multilayer ceramic components, preventing cracks and avoiding barrel polishing damage.
A Cu-including glass region in the MLCC base electrode improves Cu plating adhesion, sealing, and resistance to hydrogen diffusion.
A thin semiconductor capacitor uses top-bottom terminals and laser-drilled PCB connections to save surface area and resist warping or cracking.
A raised resin body between outer electrodes absorbs mounting loads in a semiconductor capacitor package to prevent dielectric breakage.
Localized glass content and thin outer electrode layers improve MLCC bonding while limiting alloying, blisters, and moisture-related failure.
Core-shell and uniform dielectric particles help thin MLCC layers raise capacitance while limiting leakage current and insulation breakdown.
Curved internal electrode edges lengthen the side moisture path in compact MLCCs, improving insulation and capacitor reliability.
Localized silicon concentration differences in ceramic dielectric layers improve moisture resistance reliability at lamination boundaries.
Sulfur-coated glass and tin-coated copper block moisture and hydrogen ingress in thin MLCC outer electrodes, improving plating reliability.
A five-layer external electrode stack uses an intermediary metal film to improve Ni layer adhesion, limit hydrogen diffusion, and protect insulation resistance.
A metal diffusion region between internal electrode portions blocks moisture ingress, enabling thinner external electrodes without losing reliability.
Projecting external electrode portions spread mounting stress from warped substrates, helping large multilayer ceramic capacitors resist breakage.
A dual-glass outer electrode places more bismuth-rich domains at the surface to block plating solution ingress while preserving ceramic adhesion.
An insulating buffer layer defines the active capacitor region, protecting thin dielectric or ionic layers from etch damage and edge shorting.
An ALD liner with non-Cl precursors enables conformal noble metal capacitor electrodes with low resistivity and reduced contamination.
Distributed perimeter interconnects cut parasitic inductance in a MIM capacitor, improving self-resonant frequency and Q-factor at RF.
Using Cu-Sn positive electrodes and Cu with noble-metal additives on negative electrodes limits oxygen ion segregation in thin-dielectric MLCCs.
A silane coupling layer and limited electrode wraparound help thin MLCCs resist flux-driven moisture ingress, corrosion, and reliability loss.
Extended internal electrode exposure increases electrode contact area, helping thin LW reversed MLCCs resist cracks in high-density mounting.
Localized In and Sn doping near the MLCC internal electrode boosts dielectric constant, insulation resistance, and harsh-condition reliability.
Obtuse coupling surfaces and a protruding end face reduce air bubbles at electrode step portions, improving capacitor moisture resistance.
Asymmetric internal electrode lengths shift the MLCC center of gravity to reduce tombstoning and improve mounting reliability during soldering.
Controlled sulfur states in a nickel plating layer cut soldering stress and oxidation, improving crack resistance and solder mountability.
Adjusted electrode spacing in edge and transition regions reduces step differences, limits moisture infiltration, and improves capacitor reliability.
Embedded capacitance sensors in a road grid detect vehicles, pedestrians, and debris in occluded areas to improve localization accuracy.
Thin protective layers and dummy electrodes align firing shrinkage in multilayer ceramic capacitors, reducing cracks while preserving compact, high-capacity design.
A liner-plus-noble-metal electrode stack enables conformal ALD deposition with low resistivity while avoiding Cl contamination, leakage, and corrosion.
Larger lower-electrode terminal and via dimensions improve heat conduction in thin-film capacitors used near switching elements.
Region-specific dielectric particle sizing raises effective capacitance while promoting sintering and rare earth solid solution for better reliability.
Grooved frame terminals confine solder flux around multilayer capacitor bonds, improving insulation resistance and durability under high voltage.
Adding yttrium to nickel internal electrodes helps thin multilayer capacitors keep uniform thickness and connectivity, improving insulation resistance.
Continuous electrodes replace vias in ceramic microelectronics, simplifying manufacture while improving connection reliability and capacitance.
Alternating Ni or Cu positive electrodes with noble-metal negative electrodes suppresses oxygen ion segregation and insulation degradation under high fields.
A low-melting outer electrode lets capacitor wire bond easily to substrate pads, helping shrink capacitor size without harder mounting.
A 3D network capacitor in a recess boosts capacitance in limited area while reducing dielectric defects and easing fabrication.
Electroplated terminal electrodes with smooth, uniform thickness enable direct wire formation on embedded MLCCs and simplify board packaging.
Stress-relief crack portions in the plated electrode absorb external force and help prevent multilayer ceramic body cracking.
By shifting internal electrode end positions, this MLCC structure cuts acoustic noise without spacers while supporting smaller size and higher capacitance.
Alternating dielectric and electrode layers with terminals on both faces shorten electrical length and cut insertion loss on dense PCBs.
Trimming sintered MLCC surfaces after shrinkage deformation enables uniform external electrodes, reducing short circuits and improving capacitance.
Grouped openings in stacked internal electrodes lower electric field and stress in multilayer ceramic capacitors, reducing cracks and delamination.
Controlled grain-boundary chemistry in thin MLCC dielectric layers raises withstand voltage and high-temperature reliability without sacrificing capacitance.
A defined gap between external electrodes and resist film improves solder wetting and pad contact for stable electronic component mounting.
Alternating ceramic and conductive side-margin layers reinforce multilayer capacitors while preserving insulation, shock resistance, and humidity reliability.
An oxidized tungsten-silicon capacitor structure cuts parasitic capacitance, helping miniaturized transistors keep stable high-frequency operation.
Conductive cement electrodes separated in the wellbore create a capacitor that stores electrical energy without sacrificing zonal isolation.
Nanopores in silicon-containing outer electrodes gasify plating-generated hydrogen ions, protecting ceramic insulation resistance.
Alternating large and small stacked capacitor plates reduce corner leakage while preserving TDDB and breakdown voltage in dense semiconductor structures.