A combined optoelectronic measurement system for μm superconducting filaments at low temperature
A measurement system and optical measurement technology, used in electromagnetic measurement devices, electric/magnetic solid deformation measurement, measurement devices, etc., can solve the problems of low reliability, large measurement error, poor measurement angle accuracy, etc. Poor performance, good measurement angle accuracy, and the effect of eliminating systematic errors
Inactive Publication Date: 2011-12-14
BEIJING XIZHUO INFORMATION TECH CO LTD
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Problems solved by technology
[0007] (1) Poor measurement angle accuracy: the quality of conventional extensometers is much greater than that of pure NbTi superconducting wires, which will pull the μm-level filaments and make them bend, which greatly affects the experimental measurement of μm-level superconducting wires. angle;
[0008] (2) The reliability of the experiment is low: the extensometer is clamped to the μm-level filament, and the knife edge of the extensometer can easily cut off the superconducting filament, making the experiment impossible;
[0009] (3) The measurement error is large at low temperature: In the extremely low temperature region (such as 77K), there are certain errors in the strain gauge measurement method based on the electrical principle and the optical detector measurement method based on the optical principle
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[0024] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0025] According to an embodiment of the present invention, a photoelectric combined measurement system for a μm-level superconducting filament at low temperature is provided. Such as figure 1 and figure 2 As shown, this embodiment includes the μm-level pure superconducting wire 6 without the copper base, and the μm-level superconducting wire optical measurement device and the μm-level superconducting wire respectively arranged in conjunction with the μm-level pure superconducting wire 6 Material electrical measuring device.
[0026] In the above embodiment, the above-mentioned μm-level superconducting wire optical measurement device includes a low-temperature bo...
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The invention discloses a mu m-sized superconducting wire material low-temperature photoelectric combined measurement system, which comprises a mu m-sized pure superconducting wire material, a mu m-sized superconducting wire material optical measurement device and a mu m-sized superconducting wire material electrical measurement device, wherein copper base is removed from the mu m-sized pure superconducting wire material; and the mu m-sized superconducting wire material optical measurement device and the mu m-sized superconducting wire material electrical measurement device are respectively matched with the mu m-sized pure superconducting wire material. The mu m-sized superconducting wire material low-temperature photoelectric combined measurement system can overcome the defects of poor angle measurement accuracy, low experiment reliability, large measurement error at low temperature and the like in the prior art to realize good angle measurement accuracy, high experiment reliability and small measurement error at the low temperature.
Description
technical field [0001] The invention relates to superconducting material measurement technology, in particular to a photoelectric combined measurement system for μm-level superconducting filaments at low temperature. Background technique [0002] Niobium-titanium (NbTi) superconducting composite wire is a multi-scale composite material, mainly composed of pure NbTi superconducting wire and copper matrix; among them, the order of magnitude of pure NbTi superconducting wire is μm. [0003] In the existing technology, the extensometer is generally clamped directly on the pure superconducting filament for the measurement of the μm-level wire. Usually, because the mass of the conventional extensometer is much larger than that of the pure NbTi superconducting wire, it will pull the μm-scale filament and make it bend, which greatly affects the angle of the experimental measurement of the μm-scale superconducting wire. [0004] Specifically, in the prior art, there are roughly two ...
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IPC IPC(8): G01B11/16G01B7/16
Inventor王省哲关明智周又和
OwnerBEIJING XIZHUO INFORMATION TECH CO LTD