Device for monitoring environmental parameter in test box used in ultrasonic flaw detector calibration device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIAN KUOLI MACHANICAL & ELECTRICAL TECH
- Publication Date
- 2012-05-16
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of ultrasonic flaw detector verification, and in particular relates to a device for monitoring environmental parameters in a test box for an ultrasonic flaw detector verification device. Background technique
[0002] With the continuous development of modern large-scale industrial production, especially the high development of atomic energy, aviation and aerospace technology, non-destructive testing technology has been paid more and more attention by people. Nowadays, the materials used in the industry are gradually replaced by special materials such as high temperature resistance, cutting resistance, precious metals, complex alloys, and composite materials from the original general materials. In addition, the specific performance and high price of the above-mentioned special materials, as well as the strict requirements for personal and product safety guarantees, force the use of detection methods that do n...