Method and device for testing high temperature resistance of magnetic head

A technology of high temperature resistance and magnetic head is applied in the field of devices for testing the performance of magnetic heads, high temperature resistance performance of magnetic heads, and devices for testing high temperature resistance performance of magnetic heads. Effect

Active Publication Date: 2012-10-31
SAE MAGNETICS (HK) LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] Moreover, the above method is only applicable to magnetic heads with built-in heating elements, and this method cannot be used to test the high temperature resistance of magnetic heads without heating elements

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  • Method and device for testing high temperature resistance of magnetic head
  • Method and device for testing high temperature resistance of magnetic head
  • Method and device for testing high temperature resistance of magnetic head

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Embodiment Construction

[0046] Several different preferred embodiments of the present invention will now be described with reference to the accompanying drawings, wherein like reference numerals in different drawings represent like parts. As mentioned above, the essence of the present invention is to provide a method for testing the high temperature performance of a magnetic head, which applies a magnetic field to the magnetic head in a direction perpendicular to the shielding layer, so as to screen out defective magnetic heads that have poor performance when used in a high temperature environment.

[0047] A conventional magnetic head for a magnetic head slider generally includes a read head for reading data from a magnetic disk and a write head for writing data to the magnetic disk. The read head is usually constituted by an MR read head, for example, there are current vertical planar (CPP), current in-plane (CIP), TMR, GMR or AMR read heads. For ease of understanding, the present invention only fo...

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Abstract

The invention discloses a method for testing high temperature resistance of a magnetic head. The magnetic head comprises an air bearing surface and two shielding layers. The method includes: applying a plurality of first magnetic fields with different intensities to the magnetic head in the first direction and measuring a first output parameter curve; repeatedly applying second magnetic fields with different intensities in the second direction, simultaneously applying changed first magnetic fields in the first direction, and measuring a plurality of second output parameter curves; and judging whether changes exceeding an admissible value exist in the first output parameter curve and the second output parameter curves or not so as to screen defective magnetic heads, wherein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The defective magnetic heads with poor high temperature resistance can be highly precisely screened without being heated.

Description

technical field [0001] The invention relates to a method for testing the performance of a magnetic head, in particular to a method for testing the high temperature resistance of the magnetic head. Moreover, the present invention relates to a device for testing the performance of the magnetic head, in particular to a device for testing the high temperature resistance performance of the magnetic head. Background technique [0002] A hard disk drive containing multiple spinning platters is commonly used to store data on magnetic media on its platter surfaces, while a movable head containing a read sensor is used to read data from the magnetic tracks on the platter surfaces. [0003] Currently, a magnetoresistive (MR) read head is widely used in mainstream magnetic heads because it is embedded with a higher-sensitivity MR element. Before the magnetic head is used, a series of performance tests must be carried out, such as high temperature resistance performance, dynamic flying ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11B5/455
Inventor 梁钊明雷卓文李文杰林浩基梁国锦梁卓荣丁菊仁倪荣光
Owner SAE MAGNETICS (HK) LTD
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