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Image compensation method applied to thin-layer chromatogram scanner and control system

An image compensation and thin-layer chromatography technology, applied in the field of analytical instruments, can solve problems such as errors

Inactive Publication Date: 2013-01-09
CHINA UNIV OF GEOSCIENCES (WUHAN)
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, voltage adjustment is a dynamic process during regulation control, which may also cause errors; in addition, when the excitation voltage changes, the output signal of the photomultiplier tube is not linear with the excitation voltage change, which will also cause errors

Method used

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  • Image compensation method applied to thin-layer chromatogram scanner and control system
  • Image compensation method applied to thin-layer chromatogram scanner and control system
  • Image compensation method applied to thin-layer chromatogram scanner and control system

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with specific embodiments.

[0037] The present invention provides a kind of image compensation method in order to solve the shortcoming that existing thin-layer chromatography scanner exists in use, concrete method is as follows:

[0038] (1) The monitoring photomultiplier tube on the scanner records the light intensity data matrix C when the light source on the scanner scans the target object ij , remember to do:

[0039] c 11 , c 12 . . . c 1 ( n - 1 ) ...

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Abstract

The invention provides an image compensation method applied to a thin-layer chromatogram scanner. The method comprises the following steps that: a monitoring photomultiplier tube on a scanner is used for recording a light intensity data matrix when a light source on the scanner is used for scanning a target object, light intensity mean intensity is calculated according to the light intensity data matrix, and the light intensity distribution matrix is calculated by utilizing the light intensity data matrix and the light intensity mean intensity; a determination photomultiplier tube on the scanner is used for recording a reflection light data matrix when the light scans the target object, the reflection light data matrix is corrected by utilizing the light intensity distribution matrix so as to counteract the influence of the light intensity variation on the detection data of the photomultiplier tube; and finally analysis is conducted according to reflection tube data correction matrix and the light intensity mean intensity to obtain the scanning data. The invention also provides a data collection and control system based on the image compensation method. The method and the system have the following advantages that (1) the scanning speed is fast; (2) stability in detection is realized; and (3) the processing method is simple and convenient, and image denoising is easy to realize.

Description

technical field [0001] The invention provides an image compensation method, which is suitable for thin-layer chromatography scanners. The invention also provides a data acquisition and control system based on the image compensation method, which belongs to the field of analytical instruments. Background technique [0002] Thin Layer Chromatography (Thin Layer Chromatography) is often expressed by TLC, also known as thin layer chromatography, which belongs to solid-liquid adsorption chromatography. It is a trace, fast and simple chromatography developed in recent years, which combines the advantages of column chromatography and paper chromatography. In recent years, thin-layer chromatography has also been widely used in the synthesis of drugs and the separation and analysis of active ingredients in Chinese herbal medicines. It has the characteristics of quick learning, easy to master, and flexibility; and it can change the developing agent and developing direction at any tim...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N30/90
Inventor 吴涛杨代华李勇波甘明何王勇
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)
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