Rapid phase unwrapping method based on quality diagram region segmentation

A technology of phase unwrapping and area segmentation, which is applied in the direction of measuring devices, instruments, and optical devices, etc., can solve problems such as irregular surface brightness, undersampling, and edge discontinuity, and achieve a high degree of automation, increase speed, and improve operation. efficiency effect

CN103913128AInactive Publication Date: 2014-07-09HARBIN ENG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2014-07-09
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention belongs to the technical field of computer measurement, and particularly relates to a rapid phase unwrapping method based on quality diagram region segmentation. The rapid phase unwrapping method includes the steps of capturing wrapped phase diagrams obtained through processing with a camera, calculating quality diagrams according to the wrapped phase diagrams, filtering the quality diagrams with a phase differential-difference algorithm, automatically obtaining a region segmentation threshold value, dividing the wrapped phase diagrams into regions with different priorities with the obtained region segmentation threshold value, completing region phase unwrapping with a simple path tracking phase unwrapping algorithm, conducting phase unwrapping, and combining sets after phase unwrapping according to the priority sequence from high to low. By means of the rapid phase unwrapping method, the simple path tracking phase unwrapping algorithm based on region segmentation is adopted, and the phase unwrapping speed can be quickened on the premise that the phase unwrapping accuracy is not reduced to the greatest extent. By means of the rapid phase unwrapping method, the requirements for high accuracy, rapid unwrapping, noise jamming resistance and the like of structured light vision three-dimensional measurement are met.
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Description

technical field

[0001] The invention belongs to the technical field of computer measurement, and in particular relates to a fast phase unwrapping method based on mass map area division. Background technique

[0002] Structured light vision measurement is a new method for measuring the three-dimensional surface shape of objects. It has been widely used in industrial inspection, virtual reality, cultural relics protection and medical engineering in recent years due to its characteristics of non-contact, convenience, speed and high precision. Applications. A structured light vision measurement system generally consists of a projection device, a camera, and an image processing system. The principle of structured light vision measurement is to project one or more encoding patterns onto the measurement scene, capture the projected image of the scene with a camera, and then use triangulation to obtain depth information by matching the corresponding points of the projection pattern...

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Embodiment Construction

[0045] The present invention will be further described below in conjunction with the accompanying drawings.

[0046] The present invention proposes a fast phase unwrapping method based on mass map region segmentation, the required equipment and specific experimental steps of the method are as follows:

[0047]Required equipment: 1. Projector 2. Camera 3. Computer 4 Object to be measured 5. The projector and camera are connected to computer 4 through cables.

[0048] The invention includes step 1: performing grating projection on the object and calculating the wrapping phase.

[0049] Step 2: Use the Phase Derivative Variance (Phase Derivative Variance) algorithm to calculate the mass map of the package phase.

[0050] Step 3: Carry out mean filtering on the quality map, and obtain the filtered quality map as the quality map used in the following steps.

[0051] Step 4: According to the obtained quality map information, perform automatic multi-threshold segmentation based on ...