Minisatellite integration comprehensive test system based on MAC Panel

Abstract

A minisatellite integration comprehensive test system based on an MAC Panel solves the problems that the number of minisatellite ground test devices is large, the size is large, the universality is poor, and the design and development cycle is long. Devices of three branch systems (a power supply and distribution branch system, a measurement and control system and a star service branch system) of the minisatellite comprehensive test system are integrated in one device, so that the size, the number, the cost and the development cycle of the test devices are greatly reduced. On the basis that PXI equipment of the NI company is used for achieving integration of the functions of the three test branch systems, a large-scale interconnection mechanism produced by the MAC Panel company is used for achieving satellite-to-ground interface adaption and free allocation of equipment inside signals, finally, the internal structure and external interface function of the minisatellite integration ground test system is achieved, and the integration and universalization of the minisatellite ground comprehensive test system are achieved.

Description

technical field [0001] The invention relates to a small satellite integrated comprehensive test system based on MAC Panel, which can be applied to the comprehensive test of small satellites in the aerospace field. Background technique [0002] As an important link in the whole development process of small satellites, the comprehensive test of small satellites has a great influence on the development cycle, development cost and development efficiency of satellites. Although the current test system can meet the current satellite test requirements, it is difficult to meet the multi-type and high-output requirements of future small satellites due to the constraints of its own test technology. Under the current test mode and test system architecture, it is difficult to complete batch, industrialized, short-cycle, and intelligent model test tasks, and it is impossible to effectively improve test reliability. In the existing mode, the test system is huge, with low versatility and ...

AI Technical Summary

Problems solved by technology

[0003] The problem solved by the technology of the present invention is: to overcome the deficiencies of the prior art, to carry out miniaturization and integrated transformation of the three test sub-systems of power supply and distribution, measurement and control, and star service, which seriously restrict the rapid test in the existing small satellite ground integrated system, and The functions of the three test subsystems are integrated into one chassis, which realizes the integration, miniaturization and generalization of the comprehensive test system, and solves the problems of large number of small satellite ground test equipment, large volume, poor versatility, and long design and development cycle. question

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