Minisatellite integration comprehensive test system based on MAC Panel

A comprehensive test and satellite technology, applied in the direction of measuring devices, instruments, etc., can solve the problems of large number of small satellite ground test equipment, long design and development cycle, poor versatility, etc., to improve test efficiency, reduce reconfiguration time, reduce The effect of device volume

Active Publication Date: 2014-08-13
AEROSPACE DONGFANGHONG SATELLITE
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AI Technical Summary

Problems solved by technology

[0003] The problem solved by the technology of the present invention is: to overcome the deficiencies of the prior art, to carry out miniaturization and integrated transformation of the three test sub-systems of power supply and distribution, measurement and control, and star service, which seriously restrict the rapid test in the existing small satellite gro...

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  • Minisatellite integration comprehensive test system based on MAC Panel

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Embodiment Construction

[0016] Such as figure 1 As shown, the present invention provides a kind of small satellite integrated comprehensive test system based on MAC Panel, comprising: PXI part, MAC Panel large-scale interconnection mechanism and external interface;

[0017] The PXI part includes a PXI chassis and a PXI board. The PXI chassis is a chassis that meets the PXI standard. The present invention adopts PXIe-1065, and the PXI board includes boards of three subsystems: the PXI board of the power supply and distribution subsystem realizes the satellite power supply The analog and digital quantities of the subsystem are collected and the control quantity is output; the PXI board of the measurement and control subsystem realizes the modulation and transmission of the remote control signal and the demodulation and decoding of the telemetry signal; the PXI board of the star service subsystem realizes RS422 communication and CAN bus test ;

[0018] The MAC Panel large-scale interconnection mechanis...

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Abstract

A minisatellite integration comprehensive test system based on an MAC Panel solves the problems that the number of minisatellite ground test devices is large, the size is large, the universality is poor, and the design and development cycle is long. Devices of three branch systems (a power supply and distribution branch system, a measurement and control system and a star service branch system) of the minisatellite comprehensive test system are integrated in one device, so that the size, the number, the cost and the development cycle of the test devices are greatly reduced. On the basis that PXI equipment of the NI company is used for achieving integration of the functions of the three test branch systems, a large-scale interconnection mechanism produced by the MAC Panel company is used for achieving satellite-to-ground interface adaption and free allocation of equipment inside signals, finally, the internal structure and external interface function of the minisatellite integration ground test system is achieved, and the integration and universalization of the minisatellite ground comprehensive test system are achieved.

Description

technical field [0001] The invention relates to a small satellite integrated comprehensive test system based on MAC Panel, which can be applied to the comprehensive test of small satellites in the aerospace field. Background technique [0002] As an important link in the whole development process of small satellites, the comprehensive test of small satellites has a great influence on the development cycle, development cost and development efficiency of satellites. Although the current test system can meet the current satellite test requirements, it is difficult to meet the multi-type and high-output requirements of future small satellites due to the constraints of its own test technology. Under the current test mode and test system architecture, it is difficult to complete batch, industrialized, short-cycle, and intelligent model test tasks, and it is impossible to effectively improve test reliability. In the existing mode, the test system is huge, with low versatility and ...

Claims

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Application Information

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IPC IPC(8): G01D21/00
Inventor 洪雷王志勇曾鸿曹丽君郝东卿
Owner AEROSPACE DONGFANGHONG SATELLITE
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