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Spectrometer with validation cell

A verification unit, spectrometer technology, applied in the direction of color/spectral property measurement, absorption/scintillation/reflection spectroscopy, instruments, etc. Capable of simultaneously supporting issues such as precise measurements

Active Publication Date: 2014-12-17
ENDRESS + HAUSER OPTICAL ANALYSIS INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Typically, bottled gas mixtures do not provide accurate, bureau-derived verification for such low-concentration measurements
Permeation tube verification techniques are also not suitable for providing reliable verification results for ethylene and propylene contamination measurements
In addition to the extreme demands on temperature stability and flow control, permeation tube devices are often not capable of reliably delivering trace gas concentrations below 10 ppm
Typical optical and TDL trace gas analyzers measuring below 50ppb cannot simultaneously support accurate measurement of trace gas levels above about 10ppm

Method used

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  • Spectrometer with validation cell
  • Spectrometer with validation cell
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Embodiment Construction

[0048] To address the above notable problems, and potentially others, of currently available solutions, one or more implementations of the subject matter provide a system capable of providing complete measurement fidelity accuracy verification capability in the optical absorption cell of a spectrometer, among other possible advantages. Methods, systems, products of manufacture, etc. The only gas required for field validation is an appropriate, readily available, low-cost zero gas. As used herein, the term "zero gas" refers to a composition of a sample measurement cell that has negligible or well-characterized light absorbance covering the target spectral signature of one or more target analytes to be detected in the sample gas mixture . The embedded verification unit includes a reference gas and is positioned such that light from the light source passes through the verification unit and the sample measurement unit on its way to the detector, which quantifies the received ligh...

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Abstract

A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

Description

[0001] This application is a divisional application of the Chinese patent application with the application number 201180002000.X, the application date is February 15, 2011, and the invention title is "spectrometer with verification unit". [0002] Cross References to Related Applications [0003] This application claims priority to US Provisional Application Serial No. 61 / 405,589, filed October 21, 2010, and US Invention Application Nos. 13 / 026,921 and 13 / 027,000, filed February 14, 2011. technical field [0004] The subject of the present application relates to the quantification of gas-phase concentrations of chemical analytes, for example using a spectroscopic analysis system comprising a verification cell with one or more reference gases or with a full or partial vacuum. Background technique [0005] Trace gas analyzers may require periodic verification of the long-term fidelity accuracy of the concentration measurements they produce relative to, for example, the perform...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/39
CPCG01J3/28G01N21/31G01N21/274G01N21/3504G01N21/031G01N2021/399G01N21/39G01J3/42G01N21/3518
Inventor A·费蒂施L·克勒X·刘M·施伦佩尔K·B·赫布利
Owner ENDRESS + HAUSER OPTICAL ANALYSIS INC
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