Method and device for microscopic examination identification

Abstract

The invention discloses a microscopic examination identification method. According to the method, a low-power objective is used for low magnification of a to-be-detected sample, then a to-be-detected target is searched in a first set of sample images obtained after low magnification, and the target position of the found to-be-detected target is determined; and then a high-power objective is used for high magnification of the target position of the found to-be-detected target, a second set of sample images obtained after high magnification are collected, the to-be-detected target in the second set of sample images is identified, and thus, the to-be-detected target found out in the first set of sample images can be accurately positioned and the to-be-detected target in the second set of sample images can be identified. The high-power objective can directly and accurately locate and acquire a target image, so microscopic examination efficiency is improved, leak detection of targets can be reduced, and the detection rate of targets can be enhanced.

Description

technical field [0001] The present application relates to the technical field of sample identification and image processing, and in particular to a method and device for microscope inspection identification. Background technique [0002] In the process of disease diagnosis and scientific research, it is often necessary to sample and make films of the specimens to be inspected, and use the method of microscopic examination to observe, analyze and judge the sample images under a high-power or low-power microscope, and provide samples for identification. Microscopic examination results. Human excrement, secretions, exfoliated cells or human tissues, animal tissues, and even plant cells can all be used as objects for microscopic examination. [0003] Existing microscopic inspection methods usually use a low-power objective lens or a high-power objective lens to magnify the sample, and then classify and identify the low-power pictures collected by the low-power objective lens an...

AI Technical Summary

Problems solved by technology

[0004] However, in the existing microscopic inspection methods, during the sample identification process, the images collected by the low-magnification objective lens and the images collected by the high-magnification objective lens are usually carried out independently. In order to accurately locate and capture the set target image, when the target in the sample image is large, it is easy to only capture a partial image by using a high-power objective lens for magnification and recognition, and it is necessary to collect multiple images for troubleshooting to accurately locate and capture a complete target image , so that the high-magnification objective lens cannot directly and accurately locate and collect the target image, which seriously affects the efficiency of microscope inspection, and it is easy to cause missed detection of the target and reduce the detection rate of the target

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