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Data mining method and system for detecting abnormal data interval

A technology of abnormal data and data intervals, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., and can solve problems such as undetectable abnormal data intervals

Active Publication Date: 2015-11-25
INSPUR BEIJING ELECTRONICS INFORMATION IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved in this application is to provide a data mining method and system for detecting abnormal data intervals. The data can only detect abnormal independent data points, but cannot detect abnormal data intervals.

Method used

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  • Data mining method and system for detecting abnormal data interval
  • Data mining method and system for detecting abnormal data interval

Examples

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Embodiment 1

[0144] Corresponding to the method provided in Embodiment 1 of a data mining method for detecting abnormal data intervals in the present application, see Figure 4 , the present application also provides Embodiment 1 of a data mining system for detecting abnormal data intervals. In this embodiment, the system includes:

[0145] The first determining unit 401 is configured to determine an interval width and a step length, and traverse target data in an interval step manner.

[0146]The first acquiring unit 402 is configured to acquire the maximum value and the minimum value of the current data interval.

[0147] The first calculating unit 403 is configured to calculate an offset of the current data interval, wherein the offset of the current data interval is a difference between a maximum value and a minimum value of the current data interval.

[0148] The second acquiring unit 404 is configured to acquire the current overall maximum value and the current overall minimum value...

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Abstract

The invention provides a data mining method for detecting an abnormal data interval. The method comprises the steps that before data mining is performed on target data, the interval width and the stepping length need to be determined; when data mining is performed on the target data, the target data are traversed in an interval-stepping mode, the maximum deviation amount of the target data is obtained dynamically step by step, the deviation rate of the current data interval is determined, and the deviation rate of the current data interval is compared with a rated deviation rate; when the deviation rate of the current data interval is larger than the rated deviation rate, abnormal data points and abnormal data intervals in the current data interval are determined; after all the target data are traversed, all the abnormal data points, the abnormal data intervals and the overall maximum and minimum values of the target data are obtained, and the abnormal intervals in the target data can be accurately and rapidly detected.

Description

technical field [0001] The present application relates to the field of data mining, in particular to a data mining method and system for detecting abnormal data intervals. Background technique [0002] With the development of technology, people pay more and more attention to the data mining of abnormal data interval. [0003] The existing abnormal data data mining is to detect outliers or isolated points. For data with time or space continuity, only abnormal independent data points can be detected, and abnormal data intervals cannot be detected. [0004] Therefore, how to effectively detect abnormal data intervals is a technical problem that those skilled in the art need to solve at present. Contents of the invention [0005] The technical problem to be solved in this application is to provide a data mining method and system for detecting abnormal data intervals. In the case of permanent data, only abnormal independent data points can be detected, but abnormal data inter...

Claims

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Application Information

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IPC IPC(8): G06F17/30
CPCG06F16/2458
Inventor 何伟
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND
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