An artificial accelerated aging test method for gis pot insulators
A pot-type insulator and accelerated aging technology, which is applied in the direction of measuring devices, instruments, and measuring electronics, can solve the problems that the aging of epoxy resin materials has not been formed, and artificial accelerated aging tests have not yet been seen, so as to ensure equivalence Effect
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[0022] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0023] In one embodiment, the present invention discloses an artificially accelerated aging method for GIS pot insulators, the method comprising the following steps:
[0024] S100, pretreating the test sample and the test electrode;
[0025] S200. Divide the test samples into two groups, and install the test electrodes, then put them into the multi-factor aging test chamber, and check the electrode arrangement and connection of the test samples;
[0026] S300, applying a constant voltage to the test sample;
[0027] S400, heating the artificial accelerated aging test platform to a set temperature;
[0028] S500. Take out a test sample from each of the two groups of test samples at intervals of aging time, take the same number, and measure the insulation resistivity;
[0029] S600. If the measured insulation resistivity of two test samples ...
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