probe

A technology of probes and adjustment devices, which is applied in the field of probes and can solve problems such as limited use

A technology of probes and adjustment devices, which is applied in the field of probes and can solve problems such as limited use

CN105445574BActive Publication Date: 2019-04-02DE&T
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Embodiment Construction

[0044] Probes manufactured according to suggested embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0045] figure 1 is a perspective view of a probe made according to a proposed embodiment of the invention, figure 2 is an exploded perspective view of a probe made according to a proposed embodiment of the present invention, image 3 is a front perspective exploded view of the first position adjustment device in the probe structure made according to the proposed embodiment of the present invention, Figure 4 Front perspective exploded view of the second position adjustment device in the probe structure made according to the proposed embodiment of the present invention.

[0046] The probe made according to the proposed embodiment of the present invention includes a first position adjusting device 100 which is moved in one direction by the rotational force of the first motor 110 , is arranged below the first posi...

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Abstract

The invention relates to a probe, characterized by comprising a first position adjusting device unidirectionally moving with the rotation force of a first motor, and a second position adjusting device arranged under the first position adjusting device, and converting the moving dirciton of the first adjusting device through the rotation force of the second motor. The first position adjusting device can convert the moving direction of an X axis into a Y axis through the second position adjusting device so that the first position adjusting device c can move along the X axis and the Y axis, and elevate to a Z axis through the first position adjusting device.

Description

technical field [0001] The invention relates to a probe (Probe). Specifically, the probe is set on the probe unit (Probe unit) and can move on it, so as to precisely control the probe unit in multiple axes (X, Y, Z). Background technique [0002] Generally speaking, the probe remains fixed on the panel of the display (including liquid crystal or flat panel display, etc.), exchanges electrical signals with the panel, and checks whether the corresponding display panel is a defective product. [0003] These probes will move with the selected probe unit according to the display panel size. Probe units with different lengths are set according to the size of different display panels. [0004] Among flat panel displays, thin film field effect transistor liquid crystal display (TFT-LCD, hereinafter referred to as TFT liquid crystal display) is the main product. With the mass production technology and research and development achievements of TFT liquid crystal display screens, it ...

Claims

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Application Information

Patent Timeline
02 Apr 2019
Publication
CN105445574B
IPC
G01R31/00; G01R1/067; G01R1/073
CPC
G01R1/067; G01R1/06705; G01R1/073
Inventors
许景喆; 崔荣燮