Groove structure on silicon carbide substrate and manufacturing method thereof

A manufacturing method and silicon carbide-based technology, applied in fine working devices, manufacturing tools, semiconductor/solid-state device manufacturing, etc., can solve problems such as roughening, affecting the accuracy of etching structures, and the inability to produce arc-shaped groove bottoms, etc. , to achieve the effect of improving the roughness

Active Publication Date: 2019-07-12
IND TECH RES INST
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In the modern era of high-density integration in semiconductor devices, more dense and fine pattern processing is required. Therefore, the trench process of silicon carbide materials is usually processed by dry etching. Although dry etching is easy to obtain high aspect ratio However, the arc-shaped groove bottom cannot be produced, so it is usually tempered in an inert gas environment after etching to produce an arc-shaped groove bottom, but the surface of the silicon carbide material will also be Roughened by the high temperature tempering process, which affects the accuracy of the etched structure

Method used

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  • Groove structure on silicon carbide substrate and manufacturing method thereof
  • Groove structure on silicon carbide substrate and manufacturing method thereof
  • Groove structure on silicon carbide substrate and manufacturing method thereof

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Embodiment Construction

[0022] Embodiments of the present invention are described in detail below with reference to the accompanying drawings. The same reference numerals in the drawings are used to designate the same or similar parts. It should be noted that the drawings have been simplified to clearly illustrate the content of the embodiments, and the size ratios in the drawings are not drawn in the same proportion as actual products, so they are not used to limit the protection scope of the present invention.

[0023] Figure 1~5 A schematic cross-sectional view of the trench structure manufacturing method according to the present invention is shown. The following paragraphs describe the fabrication process of a trench structure according to the first embodiment of the present invention. Please refer to figure 1 A silicon carbide substrate 10 is provided, and the provided silicon carbide substrate 10 may be a silicon carbide substrate that has completed an activation treatment process or has no...

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Abstract

A groove structure on a silicon carbide substrate and a manufacturing method thereof. The manufacturing method includes sequentially providing a silicon carbide substrate, forming a protective layer on the silicon carbide substrate, forming a barrier layer on the protective layer, patterning the barrier layer, the protective layer, and Form the opening, pattern the silicon carbide substrate for the hard mask using the patterned barrier layer to form trenches, remove the patterned barrier layer, perform a high temperature tempering process to form the arc-shaped trench bottom, and remove the protection Floor.

Description

technical field [0001] The invention relates to a groove structure on a silicon carbide substrate and a manufacturing method thereof, in particular to a groove structure with an arc-shaped groove bottom on a silicon carbide substrate and a manufacturing method thereof. Background technique [0002] Silicon carbide materials have the characteristics of wide band gap, high thermal conductivity, and low thermal expansion rate. As a semiconductor material with physical properties that supplement silicon, it is used in high-frequency, high-power devices, and power devices. [0003] In the modern era of high-density integration in semiconductor devices, more dense and fine pattern processing is required. Therefore, the trench process of silicon carbide materials is usually processed by dry etching. Although dry etching is easy to obtain high aspect ratio However, the arc-shaped groove bottom cannot be produced, so it is usually tempered in an inert gas environment after etching to...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H01L21/324H01L21/02B28D5/00
CPCB28D5/0058H01L21/02107H01L21/324H01L21/0475H01L21/3247H01L29/0657H01L29/1608H01L21/3081H01L21/31105
Inventor朱冠维蔡铭进
OwnerIND TECH RES INST