Semiconductor device, manufacturing method thereof and electronic device comprising device

A semiconductor and device technology, applied in electronic equipment, vertical semiconductor devices and their manufacturing fields, can solve the problems that horizontal devices are not easy to shrink, and achieve the effect of improving device performance

Active Publication Date: 2018-04-06
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to this arrangement, horizontal type devices are not easy to further shrink

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device, manufacturing method thereof and electronic device comprising device
  • Semiconductor device, manufacturing method thereof and electronic device comprising device
  • Semiconductor device, manufacturing method thereof and electronic device comprising device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present disclosure.

[0016] Various structural schematic diagrams according to embodiments of the present disclosure are shown in the accompanying drawings. The figures are not drawn to scale, with certain details exaggerated and possibly omitted for clarity of presentation. The shapes of the various regions and layers shown in the figure, as well as their relative sizes and positional relationships are only exemplary, and may deviate due to manufacturing tolerances or technical limitations in practice, and those skilled in the art will Regions / layers with different shapes, s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a semiconductor device, a manufacturing method thereof and an electronic device comprising the device. According to an embodiment, the semiconductor device may include a substrate, a first source / drain layer, a channel layer, a second source / drain layer and a gate stack, wherein the first source / drain layer, the channel layer and the second source / drain layer are sequentially stacked on the substrate, the second source / drain layer comprises a first semiconductor material having stress, and the gate stack is formed around the periphery of the channel layer.

Description

technical field [0001] The present disclosure relates to the field of semiconductors, and in particular, to a vertical type semiconductor device, a method of manufacturing the same, and an electronic device including such a semiconductor device. Background technique [0002] In a horizontal type device such as a Metal Oxide Semiconductor Field Effect Transistor (MOSFET), the source, gate and drain are arranged in a direction substantially parallel to the surface of the substrate. Due to this arrangement, the horizontal type device cannot be easily further scaled down. Unlike this, in a vertical type device, the source, gate, and drain are arranged in a direction substantially perpendicular to the substrate surface. Therefore, vertical devices are easier to scale down than horizontal devices. Contents of the invention [0003] In view of this, it is an object of the present disclosure to provide, at least in part, a vertical type semiconductor device capable of providing ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/78H01L29/36H01L29/10H01L21/336
CPCH01L21/8234H01L21/823412H01L21/823437H01L21/823487H01L27/088H01L29/775B82Y10/00H01L29/41741H01L29/66439H01L29/66469H01L29/0676H01L29/267H01L29/66742H01L29/78642H01L29/0649H01L29/42392H01L29/66666H01L29/7827H01L29/0847H01L29/66522H01L29/42376H01L29/7848H01L21/823418H01L21/82345H01L21/823475H01L21/823842H01L21/823871H01L29/0638H01L29/1083H01L29/0653H01L29/66712H01L29/7813H04N13/332H04N13/111H04N13/366H04N13/398G05B23/0216G05B2219/32014G06F3/04817G06F3/0482G06T19/006H04N7/181G06V20/40G06V20/44G06V2201/06H04N23/698H04N23/90H01L21/02532H01L21/3065H01L29/04H01L29/165H01L21/02636H01L21/2252H01L21/2258H01L21/31053H01L21/324H01L29/1037H01L29/1054H01L29/1095H01L29/152H01L29/205H01L29/45H01L29/66431H01L29/66462H01L29/6656H01L29/7788H01L21/3083H01L21/8221H01L21/823807H01L21/823814H01L21/823864H01L21/823885H01L27/092
Inventor 朱慧珑
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products