Data-driven fault-tree analysis method, data-driven fault-tree analysis device and data-driven fault-tree analysis equipment

A fault tree analysis, data-driven technology, applied in electrical digital data processing, generation of response errors, instruments, etc., can solve problems such as low reliability, and achieve the goal of improving reliability, overcoming underutilization, and improving fault management efficiency. Effect

Inactive Publication Date: 2018-09-07
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST THE FIFTH ELECTRONICS RES INST OF MIITCEPREI LAB +1
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Problems solved by technology

[0004] Based on this, it is necessary to provide a data-driven fault tree analysis method, device and sy

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  • Data-driven fault-tree analysis method, data-driven fault-tree analysis device and data-driven fault-tree analysis equipment
  • Data-driven fault-tree analysis method, data-driven fault-tree analysis device and data-driven fault-tree analysis equipment
  • Data-driven fault-tree analysis method, data-driven fault-tree analysis device and data-driven fault-tree analysis equipment

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Embodiment Construction

[0048] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiment of the invention is shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0049] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention. The terminology used in the specification of the present invention herein is only for the purpose of describing specific embodiments, and is not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more related listed it...

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Abstract

The invention relates to a data-driven fault-tree analysis method, a data-driven fault-tree analysis device and data-driven fault-tree analysis equipment. The data-driven fault-tree analysis method can include the steps of: generating a fault tree, which corresponds to a fault top event, according to historical fault data of the fault top event, wherein the fault tree includes multiple layer bottom events; quantitatively processing the fault tree to obtain fault probability corresponding to each layer bottom event and a Fussell-Vesely importance degree of each minimum cut set, wherein the minimum cut sets are cut sets which are obtained by qualitatively processing the fault tree and correspond to the fault top event; and generating state evaluation data of to-be-analyzed equipment according to each fault probability and each Fussell-Vesely importance degree. By adopting the method, fault management efficiency is improved, and reliability of equipment fault management is also improved.

Description

Technical field [0001] The technical field of fault analysis of the present invention particularly relates to a data-driven fault tree analysis method, device and system. Background technique [0002] With the development of science and technology, the scale of the equipment is getting bigger and bigger, and the complexity of the equipment is getting higher and higher, but once the equipment fails, it will cause huge losses. Therefore, the reliability research of equipment is of great significance, and effective fault management is an important guarantee for the continuous and stable operation of equipment. In the process of fault management, the application of historical data is one of the important links. The historical data of the failure can guide the formulation of failure prevention measures and reflect the weaknesses of the equipment. However, the application of historical fault data is a dilemma in improving the reliability of equipment. One of the important reasons is ...

Claims

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Application Information

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IPC IPC(8): G06F11/07
CPCG06F11/079
Inventor 刘杰王晓翼曾广移卢勇巩宇杨小龙黄小凤李德华伍志韬李丹云雷徐思琰吴波
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST THE FIFTH ELECTRONICS RES INST OF MIITCEPREI LAB
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