Variability measurement based production cycle time prediction method of multi-product production line

Abstract

The invention relates to a variability measurement based production cycle time prediction method of a multi-product production line, belongs to the technical field of production line management, and aims at providing the method for measuring the variability of the production line with a serial-parallel-serial characteristic under the condition of mixed production of multiple products and corresponding products. The method comprises that original data, historical operation data and future periodic plan data of each workstation of the production line are extracted and processed; logic workstations of products are constructed according to practical link passing conditions of the products, and the logic workstations are connected in series to form a logic production line of the products; according to composition of basic data and the logic production line, the variability of each logic workstation in the product logic production line as well as the transfer variability between the logic workstations are calculated; and queuing time of each logic workstation in a future period is calculated on the basis of a VUT equation, and queuing time and effective process time of all logic workstations are accumulated to obtain a integral production period of the production line.

Description

technical field [0001] The invention belongs to the technical field of production line management, and in particular relates to production cycle prediction under the condition of multi-product mixed production. Background technique [0002] The production cycle (Cycle Time, CT) is one of the key performance indicators of the product (such as semiconductor chip packaging and testing) production line. It refers to the average time spent by a batch of products as a work-in-process (WIP) in the production line. The production cycle is a key parameter for making a production plan. If the CT of the production line can be accurately predicted, the production plan will be more reasonable and the production efficiency will be improved accordingly. The semiconductor chip packaging and testing production line includes many processes, and each process corresponds to a corresponding workstation (Workstation). The product is processed as a work-in-progress through each workstation in sequ...

AI Technical Summary

Problems solved by technology

This multi-product mixed production and "serial-parallel-serial" equipment composition characteristics make the effective processing time composition of the workstation very complicated, which in turn leads to the complexity of the measurement of the variability of the workstation. At present, there is no corresponding scientific and reasonable The measurement method, which has become the biggest obstacle to predict the production cycle of this type of production line based on the VUT equation

[0004] Although, the application number is 200810201503.X, and the patent application titled "production cycle target measurement and system" discloses a method of predicting (or measuring) the production cycle by directly fitting the relationship between utilization rate and queuing time , although this method can also achieve the goal of production cycle prediction, it only considers the utilization parameter for modeling, so once the variability changes (product and link changes) during the production cycle, the method will fail; in addition, the The scheme does not distinguish the cycle of each product in the case of multi-product mixed flow, so it can only calculate the overall production cycle of multiple products

That is, because it completely regards the workstation as a black box, it cannot distinguish the specific impact of each device connected in parallel in the workstation (equipment corresponds to a link) and different products passing through the same workstation on the production cycle, and cannot provide more detailed information for further performance optimization. Granular Directional Guidance

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