Digital circuit experiment box and using experiment method
A technology of digital circuit and experiment box, applied in the field of teaching experiment box, can solve the problems of many hidden troubles, aging, and easily damaged digital chips, etc., and achieve the effect of compact structure, easy maintenance and long service life.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0030] figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 In the shown embodiment 1, a digital circuit experiment box includes an experiment box body, the experiment box body is equipped with an experiment box panel 10, a built-in power supply, a variety of signal sources and a plurality of experimental digital display tables. A signal source, a logic indicating circuit board 30 and a digital display circuit board 20, the logic indicating circuit board 30 and a logic indicating comparator circuit 40 are electrically connected, and a logic level indicator area, a digital display area 12, and a clock signal indicator are configured on the experiment box panel. Area, trigger signal plug-in area, digital circuit chip soldering connection area 15, multiple analog devices and component posts for expansion, multiple analog devices include multiple LED indicators and buzzers that are welded on the panel of the experiment box device, relay, resistor 11 and capacitor; the logic...
Embodiment 2
[0032] An experimental method for using a digital circuit experiment box, comprising the following experimental steps:
[0033] a be familiar with the layout of the multiple signal sources that the digital circuit experimental box described in embodiment 1 is configured, a plurality of experimental digital display tables and the experimental box panel and the familiar steps of the experimental method of use;
[0034] b According to the purpose and requirements of the circuit principle experiment teaching course, select the actual switching characteristics of the transistor, the logic function and parameter test of the TTL integrated logic gate, the logic function and parameter test of the CMOS integrated logic gate, the connection, drive and combination of the integrated logic circuit Design and testing of logic circuits, decoders and their applications, data selectors and their applications, flip-flops and their applications, counters and their applications, shift registers an...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com