Test system and method of display panel

A display panel and test system technology, applied to static indicators, instruments, etc., can solve problems such as data rewriting, data error data, etc.

Active Publication Date: 2019-04-09
HKC CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present application provides a test system and test method of a display panel to solve the problem that the power supply unit will be restarted briefly after

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  • Test system and method of display panel
  • Test system and method of display panel
  • Test system and method of display panel

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Embodiment Construction

[0035] In order to enable those skilled in the art to better understand the solution of the application, the technical solution in the embodiment of the application will be clearly described below in conjunction with the drawings in the embodiment of the application. Obviously, the described embodiment is the Some examples, but not all examples. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0036] The terms "comprising" and any variations thereof in the specification and claims of the present application and the above drawings are intended to cover non-exclusive inclusion. For example, a process, method or system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units not listed, or optionally further includes Other steps or unit...

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PUM

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Abstract

The invention is applicable to the technical field of display, and provides a test system and a test method of a display panel, and the test system of the display panel comprises a signal test unit, apower supply unit, a time sequence control unit and a delay starting unit. A delay starting unit is arranged between the power supply unit and the time sequence control unit, and the power supply unit is temporarily restarted again after power failure. A time delay signal is outputted so as to control the power supply state of the power supply unit to the time sequence control unit, so that the restart of the time sequence control unit after power failure caused by short restart of the power supply unit after power failure causes a problem that the memory cell cannot meet the rewriting condition, and the data of the memory cell is prevented from being rewritten.

Description

technical field [0001] The present application belongs to the field of display technology, and in particular relates to a test system and a test method for a display panel. Background technique [0002] In the process of using the FPD Tester (Flat Panel Display Tester, signal test unit) to light the OC (Opencell, LCD panel), the power supply unit in the LCD panel converts the 12V power signal of the FPD Tester into 3.3V for the TCON (Timing controller , timing control) and EEPROM (Electrically Erasable Programmable read only memory, electrically erasable read-only memory), when the OC draws a large current abnormally, the FPD Tester will start the OCP (over current protect, over-current write protection) to cut off the OC Electrical processing, after starting the OCP, WP (Write Protect, write protection), VDD and other signals are not controlled by the FPD Tester, so that the data in the OC is written, garbled data is written, and the data is rewritten. [0003] Specificall...

Claims

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Application Information

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IPC IPC(8): G09G3/00G09G3/36
CPCG09G3/006G09G3/36
Inventor 周杭
Owner HKC CORP LTD
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