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Reliability Evaluation Method of Embryo Electronic Cell Array under Temperature Reserve Mode

A cell array and reliability technology, applied in the field of computer systems based on biological models, can solve problems such as the failure detection coverage rate cannot reach 100%, the array cannot be achieved, and the input and output modules and control modules cannot fail, etc. Effectively assess reliability and improve accuracy

Active Publication Date: 2021-01-26
ARMY ENG UNIV OF PLA
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Problems solved by technology

In the existing array reliability evaluation methods, it is assumed that the fault detection coverage of electronic cells is 100%, but the fault detection coverage of the existing fault detection methods for arrays cannot reach 100%.
In the self-repair process of the array failure, in order to ensure the realization of the self-repair process, the address module, input and output module and control module in the electronic cell cannot fail, which cannot be achieved in the actual working process of the array.

Method used

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  • Reliability Evaluation Method of Embryo Electronic Cell Array under Temperature Reserve Mode
  • Reliability Evaluation Method of Embryo Electronic Cell Array under Temperature Reserve Mode
  • Reliability Evaluation Method of Embryo Electronic Cell Array under Temperature Reserve Mode

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Embodiment Construction

[0028] Embryo electronic cell array and self-repair method: Embryo electronic cell array is a new type of hardware designed to imitate the ontogenetic mechanism of vertebrates, and has biological fault self-detection and self-repair functions. The embryonic electronic cell array is a two-dimensional array composed of electronic cells, and its structure is as follows figure 1 As shown, each electronic cell in the array represents a processing unit. The electronic cells in the array have the same structure, and are divided into working cells and idle cells according to their functions. The working cells complete specific circuit functions according to their own positions in the array, and the idle cells are used as the backup of the working cells to realize the self-repair of the malfunctioning working cells.

[0029] Depend on figure 1 It can be seen that the embryonic electronic cell mainly includes an address generator, a gene storage configuration module, a function module...

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Abstract

The invention discloses a method for evaluating the reliability of an embryonic electronic cell array in a temperature reserve mode, and relates to the technical field of computer systems based on biological models. The method includes the following steps: analyzing the working process and principle of the embryonic electronic cell array, introducing two parameters of electronic cell failure detection rate and failure repair success rate, based on k ‑out‑of‑ n Temperature reserve system reliability theory and non-homogeneous continuous time Markov reliability theory, establish the mean time to failure (Mean time to failure, MTTF) of row removal self-repairing embryonic electronic cell array and cell removal self-repairing embryonic electronic cell array Equation, the reliability of the array is measured by the array MTTF equation. The method can effectively evaluate the reliability of the embryonic electronic cell array, and improves the accuracy of array reliability evaluation.

Description

technical field [0001] The invention relates to the technical field of computer systems based on biological models, in particular to a method for evaluating the reliability of embryonic electronic cell arrays in a temperature reserve mode. Background technique [0002] At present, in the existing methods for evaluating the reliability of embryonic electronic cell arrays, in order to reduce the complexity of array reliability evaluation, idle cells in the array are regarded as thermal reserves, that is, idle cells are equivalent to working cells, and both have same failure rate. However, in the actual working process of the array, only the address module, input and output module and control module of the idle cells are connected to the circuit, and the remaining modules are not connected to the circuit. When the working cell fails, the idle cells in the array will be completely connected to the circuit. The faulty working cells are removed to realize the self-repair of fault...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G16B5/30
CPCG16B5/30
Inventor 蔡金燕孟亚峰王涛朱赛韩春辉王利伟
Owner ARMY ENG UNIV OF PLA
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