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Error collection method, device and equipment based on deep learning

A technology of deep learning and collection device, which is applied in the field of wrong question collection based on deep learning, can solve the problems of low processing efficiency and cumbersome wrong question collection process, and achieves the effect of convenient use.

Inactive Publication Date: 2019-10-18
浙江米猪控股有限公司
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AI Technical Summary

Problems solved by technology

[0005] In order to overcome the problem that the existing wrong question collection software can only cut one question at a time, the wrong question collection process is cumbersome and the processing efficiency is low, and it provides a deep learning-based software that can simultaneously cut and mark multiple questions on the page. Method, device and equipment for collecting wrong questions

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  • Error collection method, device and equipment based on deep learning
  • Error collection method, device and equipment based on deep learning
  • Error collection method, device and equipment based on deep learning

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Embodiment Construction

[0043] In order to realize the automatic collection of students' wrong questions during the learning process, some software that automatically collects wrong questions by taking pictures has appeared on the market. In these software, only one topic can be identified at a time, and the user needs to manually select the area of ​​the topic during the operation. Not only is the operation cumbersome and time-consuming, but the collection efficiency is low.

[0044] In view of this, this embodiment provides a method for collecting wrong questions based on deep learning. The method includes: obtaining an image of a homework or test paper that has been corrected and contains multiple questions (step S10); using a pre-trained recognition model based on the coordinates of the questions to perform topic segmentation on the acquired image, so as to obtain the Corresponding coordinate area (step S20). Identify the correction marks in the coordinate area corresponding to each question acc...

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Abstract

The invention provides an error collection method, device and equipment based on deep learning. The method comprises: acquiring corrected homework or test paper images containing multiple questions; carrying out topic segmentation on the obtained image by adopting a pre-trained topic coordinate-based recognition model to obtain a coordinate region corresponding to each topic; and identifying the correction trace in the coordinate area corresponding to each question according to a pre-trained detection model based on the correction trace so as to obtain the right and wrong judgment of the question.

Description

technical field [0001] The present invention relates to the field of machine learning, and in particular to a method, device and equipment for collecting wrong questions based on deep learning. Background technique [0002] It is inevitable and normal for students to make mistakes in the learning process. The wrong question itself reflects the problems and deficiencies in a student's understanding or application of knowledge. Therefore, only by finding out the loopholes in knowledge points and weaknesses in personal habits and thinking in the test-taking through wrong questions, and correcting them, can the wrong questions done be transformed into the most valuable learning resources. [0003] Now students have a large amount of exercises and a considerable amount of wrong questions. However, the efficiency of collecting wrong questions by traditional handwriting or copying and cutting and pasting is too low. Such complicated mechanical work is not easy to maintain. The so...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/34G06K9/32G06K9/62G09B7/04
CPCG09B7/04G06V10/25G06V10/267G06F18/214G06F18/254
Inventor 徐俊卢天政刁新强
Owner 浙江米猪控股有限公司
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