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Method and system for centralized test of electrical performance testing equipment

A technology of electrical performance testing and testing equipment, which is applied in the direction of TV, electrical components, image communication, etc., can solve the problems of long testing process and low work efficiency, and achieve the effect of shortening rectification time, improving quality and improving work efficiency

Inactive Publication Date: 2019-11-12
SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method and system for centralized testing of electrical performance testing equipment to solve the problems of long time-consuming testing process and low work efficiency in the prior art.

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  • Method and system for centralized test of electrical performance testing equipment
  • Method and system for centralized test of electrical performance testing equipment

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Embodiment Construction

[0029] The present invention provides a method and system for centralized testing of electrical performance testing equipment. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0030] Those skilled in the art will understand that unless otherwise stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the word "comprising" used in the description of the present invention refers to the presence of said features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, Integers, steps, operations, e...

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Abstract

The invention discloses a method and a system for the centralized test of electrical performance testing equipment. The method is characterized by comprising the steps: searching a plurality of partsof test equipment and a plurality of test parameters corresponding to a test item according to the preset corresponding relation between the test item and the test equipment and between the test itemand the test parameters when the test item of a to-be-tested electrical performance item is received; sending the test parameters corresponding to the test devices to the test devices to enable the test devices to perform parameter configuration; and after all the test devices are successfully configured, starting the test task of the test item. According to the invention, a tester directly selects one test item; according to the method and the system, the test devices and the test parameters which need to be used by the test items are automatically searched, and after the parameters of the test devices are successfully configured, the test personnel can be notified to directly start the test task, so that the working efficiency is rapidly improved. The rectification time is shortened fordevelopers, and the quality of a whole machine product is improved.

Description

technical field [0001] The invention relates to the technical field of digital television, in particular to a method and system for centralized testing of electrical performance testing equipment. Background technique [0002] At present, most digital TVs need to pass electrical performance tests during the R&D and design stages, and the National Quality Center will also randomly check whether the performance indicators of TVs are qualified. Therefore, in the research and development stage, the TV needs to pass the test of various electrical performance indicators before it can be introduced into production. The existing test method is that the tester first debugs and sets the corresponding equipment that needs to be used for the test task according to the project to be tested. Frequently testing a project requires the use of multiple signal generating devices. The test process takes a long time and the work efficiency is low. cannot be effectively improved. [0003] There...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00H04N17/04
CPCH04N17/00H04N17/04
Inventor 刘翔章李新林孙思凯
Owner SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD
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