Experimental device for shortening flicker decay time of LYSO crystal, and experimental method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
- Publication Date
- 2020-01-03
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Abstract
Description
technical field
[0001] The invention relates to a repetition frequency test device for scintillation crystals, in particular to an experimental device and an experimental method for shortening the scintillation decay time of LYSO crystals. Background technique
[0002] The development of inorganic scintillators with ultra-fast scintillation decay and high light yield has always been an important research direction and hot spot of scintillation materials. After years of development, scientists from various countries have successfully developed many inorganic scintillators with short afterglow, that is, short scintillation decay time. Its decay time is much better than traditional scintillation crystals such as BGO and NaI(Tl).
[0003] ZnO and CuI crystals are the two fastest known scintillation crystals at present, and their scintillation decay time is very short, which can reach the sub-ns level, and can meet the time requirements of X-rays or high-energy electrons with a r...