8K test signal generation device and method, storage medium and equipment

A test signal generation and test signal technology, applied in the direction of image communication, TV, electrical components, etc., can solve the problems of decreased product testing capability, increased hardware requirements, longer required time, etc., to improve test efficiency, reduce demand, The effect of improving efficiency

Inactive Publication Date: 2020-03-31
MUDAN SHIYUAN ELECTRONICS BEIJING
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Problems solved by technology

However, the limitation of this method is that the operating memory of the device must be larger than the storage space occupied by the test signal file, which limits the length of the test signal on the one hand, and increases the demand for hardware on the other hand. At the same time, the time required for the signal output process Longer, lower product testing capabilities

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  • 8K test signal generation device and method, storage medium and equipment
  • 8K test signal generation device and method, storage medium and equipment

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Embodiment Construction

[0049] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0050] Such as figure 1As shown, the embodiment of the present invention provides an 8K test signal generation device, which includes a signal storage module, a signal selection module and a signal generation module;

[0051] The signal storage module stores multiple 8K test signal files in advance.

[0052] The signal selection module selects the corresponding 8K test signal file name from the 8K signal table according to the input signal parameters, and...

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Abstract

The invention relates to an 8K test signal generation device. The 8K test signal generation device comprises a signal storage module, a signal selection module and a signal generation module; the signal storage module is used for storing a plurality of 8K test signal files in advance; the signal selection module is used for selecting a corresponding 8K test signal file name from an 8K signal tableaccording to input signal parameters and sending the 8K test signal file name to the signal generation module; and the signal generation module is used for obtaining an 8K test signal file corresponding to the 8K test signal file name from the signal storage module and outputting the signal file. The memory occupied in the 8K signal output process is reduced, so that the running memory requirement of hardware is reduced. The invention also relates to an 8K test signal generation method, a storage medium and equipment.

Description

technical field [0001] The present invention relates to the technical field of 8K television, in particular to an 8K test signal generation device, method, storage medium and equipment. Background technique [0002] Video is the main carrier of information presentation and dissemination, and ultra-high-definition video is a new round of major technological innovation after video digitization and high-definition. The ultra-high-definition video industry includes various links such as ultra-high-definition video collection, production, transmission, presentation, and application, and belongs to the integrated and innovative industrial form. The development of the ultra-high-definition video industry is conducive to promoting the overall strength of my country's information industry and cultural industry, driving the intelligent transformation and upgrading of industries with video as the core, cultivating new economic momentum, and nurturing new growth points for mid-to-high-e...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 王利芳毛珂柳玉华焦小舟马振来樊晓婷徐晖
Owner MUDAN SHIYUAN ELECTRONICS BEIJING
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