Electromagnetic pulse interference test method and system

Abstract

The invention discloses an electromagnetic pulse interference test method and system. The method comprises the following steps: stepping with a first initial voltage and a first voltage by utilizing transmission line pulse test equipment, inputting an electromagnetic pulse into a first digital circuit, and monitoring a leakage current of the first digital circuit; recording a first voltage of theelectromagnetic pulse when the first digital circuit has leakage current distortion or function abnormality; stepping with a second initial voltage and a second voltage, inputting an electromagnetic pulse into a second digital circuit which is the same as the first digital circuit, and monitoring leakage current of the second digital circuit; recording a second voltage of the electromagnetic pulsewhen leakage current distortion or function abnormality occurs in the second digital circuit; if the difference between the first voltage and the second voltage is smaller than a preset threshold value, taking the first voltage as an electromagnetic pulse interference threshold value; wherein the second initial voltage is obtained by floating up and down according to the first voltage, and the second voltage step is smaller than the first voltage step. According to the invention, the test cost of the electromagnetic pulse interference test can be reduced.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic pulse interference testing, and in particular relates to an electromagnetic pulse interference testing method and system. Background technique [0002] With the development of pulse power amplification technology, radar antenna technology and pulse weapon technology, the electromagnetic environment is becoming more and more complex, and digital circuits are more and more susceptible to electromagnetic pulse interference; when electromagnetic pulses are coupled into digital circuits, instantaneous High-amplitude voltage and / or current; when the generated voltage and / or current exceeds the capacity of the circuit, it will cause damage or even damage to the digital circuit. Therefore, it is necessary to conduct electromagnetic pulse interference tests on digital circuits to understand the immunity of digital circuits to electromagnetic pulses. When testing, the rising time of the rising edge...

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Problems solved by technology

[0004] However, when the rise time of the rising edge of the electromagnetic pulse is required to be fast enough, the cost of the Gaussian pulse generator or the double-exponential pulse generator is relatively high; Or set matching power amplifiers and monitoring equipment and other auxiliary equipment between the double-exponential pulse generators, so that the test cost of the existing electromagnetic pulse interference test method is relatively high

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