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Test case generation method, device and equipment

A test case and test system technology, applied in the field of data processing, can solve the problems of increasing system failure, wrong relationship between test nodes, omission of test nodes, etc., to reduce labor costs, ensure accuracy, and ensure stability. Effect

Active Publication Date: 2020-12-04
BANK OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, with the current method of generating test documents, the workload of testers is relatively large, and the combing of test nodes and the relationship between test nodes also relies too much on manual experience, which is prone to omission of test nodes or errors in the relationship between test nodes. As a result, the system test is not comprehensive and accurate, which increases the probability of failure after the system goes online, and in severe cases, it will cause economic losses to financial institutions and customers

Method used

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  • Test case generation method, device and equipment
  • Test case generation method, device and equipment
  • Test case generation method, device and equipment

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Embodiment Construction

[0024] In order to enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in one or more embodiments of this specification will be clearly and completely described below in conjunction with the drawings in one or more embodiments of this specification Obviously, the described embodiments are only some of the embodiments in the description, not all of them. Based on one or more embodiments in the description, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the embodiments of the description.

[0025] In an example of an application scenario in this specification, the method for generating a test case can be applied to a test system. The testing system may include a user terminal and one or more servers. The user terminal may be, for example, a tester's terminal equipment.

[0026] The server may be pre-configured...

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Abstract

The invention relates to a test case generation method, device and equipment, and the method comprises the steps that a server feeds back a business information topological structure to a user terminal after receiving a test case generation request transmitted by the user terminal; the user terminal displays the service information topological structure, receives operation information of a user oneach service information node in the service information topological structure, and feeds back the service information nodes to the server; and the server performs mapping processing on the receivedservice information nodes by using the test mapping relationship model to obtain a system test topological structure, so as to generate a test case corresponding to the test case generation request based on the system test topological structure, wherein the test mapping relationship model comprises a mapping relationship between each service information node in the service information topologicalstructure and each service system node in the service system topological structure. By utilizing each embodiment of the specification, the test case generation efficiency and accuracy can be improved.

Description

technical field [0001] This specification relates to the technical field of data processing, and in particular, relates to a test case generation method, device and equipment. Background technique [0002] The business systems of financial institutions are generally used for a long time, sometimes as long as decades, during which the business systems often need to be upgraded and function adjusted. After the business system has undergone multiple upgrades and function adjustments, the system architecture has become more and more complex. The relevant business personnel who adjust the business system and test after adjustment often only have a better understanding of the system information of the current adjustment part. Therefore, when testing, testers usually need to search a large number of historical test documents and system description information for analysis, and try to sort out the relationship between the current adjustment node and other associated nodes as compre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 吴冰郭旸李宗白战玲玲
Owner BANK OF CHINA
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