Method for solving shutter temperature drift of infrared temperature measurement equipment
An infrared temperature measurement and shutter technology, applied in the field of infrared temperature measurement, can solve the problems of temperature deviation, target temperature accuracy error, deviation, etc., to achieve the effect of improving measurement accuracy, reducing absolute temperature rise, and improving temperature measurement accuracy and stability
Active Publication Date: 2021-02-05
WUHAN GUIDE SENSMART TECH CO LTD
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Problems solved by technology
However, in the prior art, due to the high frequency of collecting the temperature rise of the shutter, there is a deviation in the acquisition of the reference shutter temperature used by the infrared temperature measurement equipment to measure the target temperature. There is an error in the accuracy of the target temperature, and there is a large deviation from the actual object temperature
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Embodiment 1
[0036] A method for solving the shutter temperature drift of infrared temperature measuring equipment, such as figure 1 ,include:
[0037] S100. Initialize the start-up of the infrared temperature measuring device, control the shutter driver IC chip to close the shutter for the first time through the GPIO interface, and when the shutter is closed, sample the shutter blades to obtain the AD conversion value B of the thermal radiation energy of the shutter with a uniform background, and at the same time The AD conversion value B of the shutter thermal radiation energy replacing the previous background.
[0038] In this embodiment, after the infrared temperature measuring device is turned on, the CPU is powered on, and the program is initialized. 2 The C communication protocol decrypts the infrared detector and configures the parameters. After the configuration is completed, the shutter driver IC is controlled by the GPIO to close the shutter. When the shutter is closed, the sh...
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A method for solving shutter temperature drift of infrared temperature measurement equipment comprises the following steps: acquiring an AD conversion value of shutter thermal radiation energy of a uniform background; obtaining a shutter temperature TK, calculating the temperature of the target object by taking the shutter temperature TK as a reference, and obtaining a Y16K value by inquiring theshutter temperature; obtaining a target scene radiation quantity AD conversion value X; acquiring a thermal sensitivity gain compensation matrix K of each pixel point in advance, and calculating a Y16value delta Y16 of target radiation by combining an AD conversion value B of shutter thermal radiation energy and an AD conversion value X of target scene radiation quantity; obtaining a corresponding Y16 value Y16T before target temperature compensation through the obtained Y16K value and the obtained delta Y16 value; carrying out shutter compensation on the corresponding Y16 value before targettemperature compensation, and taking the shutter compensated Y16 value as delta Y16K; and obtaining a Y16 value corresponding to the target object through the Y16 value Y16T corresponding to the target temperature before compensation and the shutter compensated value delta Y16K, and obtaining a target temperature T target according to a calibration curve obtained in advance. According to the invention, the temperature measurement precision and stability of an infrared temperature measurement product can be improved, and the user experience is improved.
Description
technical field [0001] The invention relates to the technical field of infrared temperature measurement, in particular to a method for solving the shutter temperature drift of infrared temperature measurement equipment. Background technique [0002] In the prior art, the temperature measurement process of infrared temperature measuring equipment is to continuously extract the shutter temperature as the measurement target temperature reference, calculate the target temperature on the basis of the shutter temperature, and calibrate the target temperature. However, in the prior art, due to the high frequency of collecting the temperature rise of the shutter, there is a deviation in the acquisition of the reference shutter temperature used by the infrared temperature measurement equipment to measure the target temperature. There is an error in the accuracy of the target temperature, and there is a large deviation from the actual object temperature. Contents of the invention ...
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IPC IPC(8): G01J5/00
CPCG01J5/00G01J2005/0077G01J5/80
Inventor马海东黄晟王鹏周汉林
OwnerWUHAN GUIDE SENSMART TECH CO LTD