Quartz lattice impurity element segregation distribution analysis method

Abstract

The invention relates to a quartz lattice impurity element segregation distribution analysis method, which comprises the following steps of: acquiring the mass, size and initial impurity content of to-be-analyzed quartz; using denudation agents with different concentrations for denudating the surface of the quartz, and acquiring the quality of the quartz denudated each time and the impurity content in the quartz denudated each time; according to the parameters, establishing a mathematical model between the average content of impurities in the denudated quartz and the depth from the corresponding part to the surface of the quartz; and through a plurality of groups of denudation tests, calculating to obtain the impurity element content and depth of a certain impurity from the surface to the interior according to the mathematical model. According to the quartz lattice impurity element segregation distribution analysis method provided by the invention, the enrichment region and the deficit region of the impurities can be obtained, the deviation between the calculation result and the actual situation is small, and the technical defect that the distribution of the impurities in the quartz cannot be accurately measured in situ by existing quantitative analysis methods such as EMPA can be overcome.

Description

technical field [0001] The invention relates to the technical field of quartz impurity detection, in particular to an analysis method for the segregation distribution of impurity elements in a quartz crystal lattice. Background technique [0002] Current testing methods for quantitative analysis of element concentrations in quartz include plasma mass spectrometry (LA-ICP-MS), secondary ion mass spectrometry (SIMS), and electron probe spectrometry (EPMA-WDS). Such as figure 1 Shown is a schematic diagram of the comparison of the minimum sample requirements of EPMA, SIMS, and LA-ICP-MS. The comparison shows that the minimum volume of EPMA is 150 μm 3 , most suitable for the quantitative analysis of low-concentration trace elements, the lower limit of the analysis concentration can reach tens of μg / g, and the scale can be accurate to 10 μm. However, the average content of trace elements in high-purity quartz is generally lower than 10 μg / g, and only some elements may reach mo...

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Problems solved by technology

[0003] In view of this, it is necessary to provide an analysis method for the segregation distribution of crystal lattice impurity elements in quartz. By approximately calculating the segregation concentration of trace impurity elements in the crystal lattice in quartz, it overcomes the inability of the existing technology to accurately measure the lattice impurity elements in natural quartz. the puzzle

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