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A method for analyzing the segregation distribution of impurity elements in quartz lattice

An analytical method and technology of impurity elements, applied in the direction of removing certain components, weighing, molecular entity identification, instruments, etc., can solve the problem of inability to accurately measure the lattice impurity elements in natural quartz, and make up for the inability to accurately measure, Make up for technical defects and small deviations

Active Publication Date: 2022-07-01
WUHAN UNIV OF TECH
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Problems solved by technology

[0003] In view of this, it is necessary to provide an analysis method for the segregation distribution of crystal lattice impurity elements in quartz. By approximately calculating the segregation concentration of trace impurity elements in the crystal lattice in quartz, it overcomes the inability of the existing technology to accurately measure the lattice impurity elements in natural quartz. the puzzle

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  • A method for analyzing the segregation distribution of impurity elements in quartz lattice
  • A method for analyzing the segregation distribution of impurity elements in quartz lattice
  • A method for analyzing the segregation distribution of impurity elements in quartz lattice

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[0031] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0032] The embodiment of the present invention provides a method for analyzing the segregation distribution of impurity elements in a quartz lattice, comprising the following steps:

[0033] S1. Obtain the mass, volume and initial impurity content of the quartz to be analyzed;

[0034] S2. Use denuding agents of different concentrations to ablate the quartz surface, and obtain the quality of each ablated quartz and the impurity content in the quartz after each ablation;

[0035] S3, according to the parameters obtained in the S1 step and the S2 step, establish a mathematical model based on the average content of i...

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Abstract

The invention relates to a method for analyzing the segregation distribution of impurity elements in a quartz crystal lattice, comprising the following steps: obtaining the mass, volume and initial impurity content of the quartz to be analyzed; using denuding agents of different concentrations to ablate the surface of the quartz, and obtaining each time the denuded quartz is eroded According to the above parameters, a mathematical model is established based on the average content of impurities in the quartz after ablation and the depth of the corresponding part from the surface of the quartz; then through multiple sets of ablation tests, according to the mathematical model calculation The content and depth of impurity elements from the surface to the interior of an impurity. The analysis method provided by the invention can obtain the enriched area and the depleted area of ​​impurities, the deviation between the calculation result and the actual situation is small, and can make up for the technical defect that the existing quantitative analysis methods such as EMPA cannot accurately measure the impurity distribution in quartz in situ.

Description

technical field [0001] The invention relates to the technical field of quartz impurity detection, in particular to a method for analyzing the segregation distribution of impurity elements in a quartz lattice. Background technique [0002] Current test methods for quantitative analysis of elemental concentrations in quartz include plasma mass spectrometry (LA-ICP-MS), secondary ion mass spectrometry (SIMS), and electron probe spectrometry (EPMA-WDS). like figure 1 Shown is the comparison diagram of the minimum sample requirements of EPMA, SIMS, and LA-ICP-MS. The comparison shows that the minimum volume of EPMA is 150 μm 3 , most suitable for the quantitative analysis of low-concentration trace elements, the lower limit of the analytical concentration can reach tens of μg / g, and the scale can be accurate to 10 μm. However, the average content of trace elements in high-purity quartz is generally less than 10 μg / g, and only some elements may reach more than ten μg / g, which is...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N5/04G16C20/20G16C10/00
CPCG01N5/04G16C20/20G16C10/00
Inventor 李育彪肖蕲航裴振宇马强雷绍民
Owner WUHAN UNIV OF TECH
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