Integrated circuit testing device

A technology for integrated circuits and testing devices, applied in the field of integrated circuit testing devices, can solve the problems of long time for loading integrated circuit chips and the like

Pending Publication Date: 2021-10-08
SUZHOU ASEN SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of this, the application proposes an integrated circuit testing device to solve the problem that the time spent loading integrated circuit chips on the testing device is too long

Method used

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  • Integrated circuit testing device
  • Integrated circuit testing device
  • Integrated circuit testing device

Examples

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Embodiment Construction

[0027] The following disclosure provides various implementations or illustrations, which can be used to achieve different features of the disclosure. Specific examples of components and arrangements are described below to simplify the present disclosure. It will be appreciated that these descriptions are merely examples and are not intended to limit the disclosure. For example, in the description below, forming a first feature on or over a second feature may include some embodiments wherein the first and second features are in direct contact with each other; and may also include In some embodiments, additional components are formed between the first and second features, such that the first and second features may not be in direct contact. In addition, this disclosure may reuse reference symbols and / or labels in various embodiments. Such repetition is for the sake of brevity and clarity, and does not in itself represent a relationship between the different embodiments and / or ...

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Abstract

An integrated circuit testing device comprises a first moving part, a second moving part and a base. The first moving part is configured to move in a first direction. The second moving part is configured to be linked with the first moving part through a transmission shaft, and when the second moving part moves in a second direction different from the first direction, the second moving part is linked with the first moving part through a transmission shaft, so that the first moving part moves in the first direction. The base is configured to bear an integrated circuit test board, wherein the first moving part is detachably arranged on the base. And when the first moving part moves in the first direction, a test position for placing an integrated circuit chip on the integrated circuit test board is exposed.

Description

technical field [0001] This application is related to a device, in detail, it is related to an integrated circuit testing device. Background technique [0002] In the prior art, when the integrated circuit chip is to be tested, the integrated circuit chip needs to be placed in the testing position of the test device first, then the upper cover is closed, and the upper cover is rotated and tightened so that the upper cover presses the chip, thereby fixing the integrated circuit Chips were then able to be tested. The whole process is cumbersome and lengthy, reducing work efficiency. Contents of the invention [0003] In view of this, the present application proposes an integrated circuit testing device to solve the problem that it takes too long to load the integrated circuit chip on the testing device. [0004] According to an embodiment of the present application, an integrated circuit testing device is provided. The integrated circuit device includes a first moving par...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2893
Inventor 邢思波
Owner SUZHOU ASEN SEMICON CO LTD
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