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Display substrate, test method and preparation method thereof, and display device

A technology for displaying substrates and test areas, which is applied in identification devices, semiconductor/solid-state device testing/measurement, instruments, etc., and can solve problems such as inability to accurately reflect the actual characteristics of transistors in the display area

Pending Publication Date: 2021-11-02
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the embodiments of the present disclosure is to provide a display substrate and its testing method, manufacturing method, and display device, so as to solve the problem that the existing testing components cannot accurately reflect the actual characteristics of the transistors in the display area

Method used

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  • Display substrate, test method and preparation method thereof, and display device
  • Display substrate, test method and preparation method thereof, and display device
  • Display substrate, test method and preparation method thereof, and display device

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Embodiment Construction

[0052] In order to make the purpose, technical solution and advantages of the present disclosure clearer, the embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. Note that an embodiment may be embodied in many different forms. Those skilled in the art can easily understand the fact that the means and contents can be changed into various forms without departing from the gist and scope of the present disclosure. Therefore, the present disclosure should not be interpreted as being limited only to the contents described in the following embodiments. In the case of no conflict, the embodiments in the present disclosure and the features in the embodiments can be combined arbitrarily with each other.

[0053] In the drawings, the size of each component, the thickness of a layer, or a region is sometimes exaggerated for the sake of clarity. Therefore, one aspect of the present disclosure is not necessarily limited to...

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Abstract

The invention provides a display substrate, a test method and a preparation method thereof, and a display device. The display substrate comprises a display area and a frame area located on the periphery of the display area, the frame area comprises at least one testing area, the display area comprises a plurality of sub-pixels, at least one sub-pixel comprises a pixel driving circuit, the testing area comprises at least one testing unit, the testing unit comprises a test transistor, a plurality of test leads and a plurality of test pins, the structure of the test transistor is the same as that of at least one transistor in the pixel driving circuit, and the test pins are connected with the test transistor through the test leads. A testing circuit is formed in the testing area, the characteristics of the test transistor in the testing circuit are basically consistent with the characteristics of the corresponding transistor in the display area, and the test transistor can accurately reflect the actual characteristics of the transistor in the display area.

Description

technical field [0001] The present disclosure relates to but not limited to the field of display technology, especially to a display substrate, a testing method, a manufacturing method, and a display device. Background technique [0002] Organic Light Emitting Diode (OLED) is an active light-emitting display device, which has the advantages of self-illumination, wide viewing angle, high contrast, low power consumption, high response speed, light and thin, bendable and low cost. With the continuous development of display technology, a flexible display device (Flexible Display) which uses OLED as a light-emitting device and is signal-controlled by a Thin Film Transistor (TFT) has become a mainstream product in the display field. [0003] The inventors of the present application found that the test components on the existing OLED display substrate cannot accurately reflect the actual characteristics of the transistors in the display area. Contents of the invention [0004] T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/32H01L21/66G09F9/30
CPCH01L22/30H01L22/32H01L22/14G09F9/301H10K59/12H10K59/1201
Inventor 何海舟石明李诗琪张静蔡建畅胡国仁孙文李仁佑
Owner BOE TECH GRP CO LTD
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