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The detection methods and devices of abnormal pictures in industrial quality inspection

A technology of anomaly detection and detection method, which is applied in the direction of measuring device, image enhancement, image analysis, etc., can solve the problems of similarity destruction between the detection picture data set and the training set, and the inability of the defect detection model to effectively detect defects, so as to achieve improvement Effect of work, effect of improving effect

Active Publication Date: 2022-08-05
江苏智云天工科技有限公司
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Problems solved by technology

[0004] In order to solve the problem that the defect detection model cannot effectively detect defects due to the destruction of the similarity between the detection picture data set and the training set, the present invention proposes the following technical solutions

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  • The detection methods and devices of abnormal pictures in industrial quality inspection
  • The detection methods and devices of abnormal pictures in industrial quality inspection
  • The detection methods and devices of abnormal pictures in industrial quality inspection

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Embodiment Construction

[0026] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0027] figure 1 This is a flowchart of the method for detecting abnormal pictures in industrial quality inspection according to an embodiment of the present invention.

[0028] It should be noted that, the execution subject of the method for detecting abnormal pictures in the industrial quality inspection according to the embodiment of the present invention may be a data processing server at the industrial quality inspection site.

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Abstract

The invention relates to the technical field of industrial quality inspection, and provides a method and device for detecting abnormal pictures in industrial quality inspection. The method includes: acquiring a first picture set in a current cycle; determining a previous cycle adjacent to the current cycle, and acquiring The second picture set in the previous cycle; call the anomaly detection model, and input the first picture set and the second picture set into the anomaly detection model to perform anomaly detection through the anomaly detection model, and obtain the anomaly detection result; when the anomaly detection result is When the first picture set is abnormal, at least one discrete picture is selected from the first picture set through the discrete sample screening model; the abnormal detection result and the discrete picture are displayed on the visual interface; the quality inspection machine is maintained according to the discrete picture. In this way, it is beneficial to avoid the problem that defects cannot be effectively detected due to the destruction of the similarity between the detection data and the sample training set, and can improve the working effect of the quality inspection machine, thereby improving the industrial quality inspection effect.

Description

technical field [0001] The invention relates to the technical field of industrial quality inspection, in particular to a method for detecting abnormal pictures in industrial quality inspection and a device for detecting abnormal pictures in industrial quality inspection. Background technique [0002] The quality inspection machine deployed in the factory performs the work of surface defect detection of workpieces. Its core workflow includes drawing, defect detection model reasoning, and sorting. The distribution of the real-time image data set and the training set of the training defect detection model is similar, which is one of the important conditions for the surface defect detection work to be accurately performed by the quality inspection machine. [0003] When the upstream process or equipment of the factory changes, it will significantly affect the distribution of real-time image data sets, and the conditions of similarity may be destroyed, resulting in the defect det...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G01N21/88
CPCG06T7/0004G01N21/8851G06T2207/20081G06T2207/20084G06T2207/30108G01N2021/8883G01N2021/8887Y02P90/30
Inventor 陈竟宇赵何张志琦
Owner 江苏智云天工科技有限公司
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