Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

X-ray analysis apparatus and x-ray analysis method

An analysis equipment, X-ray technology, applied in the direction of analyzing materials, using wave/particle radiation, using apertures/collimators, etc., can solve problems such as difficult quantitative analysis, unstable X-ray intensity, etc., to achieve stable The effect of quantitative analysis

Inactive Publication Date: 2012-06-20
HITACHI HIGH TECH SCI CORP
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the tube current does not reach the normal working range of the X-ray tube, the intensity of the X-rays generated by the X-ray tube becomes unstable, and because the intensity of the detected X-rays becomes unstable Stable, there is a disadvantage that it is difficult to carry out quantitative analysis

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • X-ray analysis apparatus and x-ray analysis method
  • X-ray analysis apparatus and x-ray analysis method
  • X-ray analysis apparatus and x-ray analysis method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] Below, refer to Figure 1 to Figure 3 The X-ray analysis apparatus and X-ray analysis method of the first embodiment of the present invention will be explained.

[0034] The X-ray analysis equipment of this embodiment is an energy dispersive fluorescence X-ray analysis equipment, and as Figure 1 to Figure 3 As shown, it includes: a sample stage 2 for fixing the sample 1; an X-ray tubular bulb (radiation source) 3, which irradiates the primary X-ray (radiation line) to the sample 1; a primary X-ray adjustment mechanism (radiation line adjustment mechanism) 4, The intensity of primary X-rays can be adjusted; X-ray detector 5 detects characteristic X-rays and scattered X-rays radiated from sample 1, and outputs signals containing energy information of characteristic X-rays and scattered X-rays; Analyzer 6 is connected to The X-ray detector 5 analyzes the above-mentioned signals; the incident X-ray adjustment mechanism 7 is placed between the sample 1 and the X-ray detect...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
strengthaaaaaaaaaa
Login to View More

Abstract

In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.

Description

technical field [0001] The present invention relates to an X-ray analysis apparatus and an X-ray analysis method suitable for use in, for example, energy dispersive fluorescence X-ray analysis and the like. Background technique [0002] In fluorescent X-ray analysis, by irradiating X-rays emitted from an X-ray source to a sample and detecting fluorescent X-rays, which are characteristic X-rays irradiated from a sample, by an X-ray detector, thereby from The energy of the fluorescent X-rays can be used to obtain an energy spectrum, thereby performing qualitative or quantitative analysis on the sample. This fluorescent X-ray analysis is widely used in process / quality control because it can quickly analyze a sample without destroying the sample. In recent years, efforts have been made to improve the accuracy / sensitivity and trace measurement thus becomes possible, making it desirable to develop an analysis technique particularly for detection of harmful substances contained in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223G21K1/02
Inventor 深井隆行的场吉毅长谷川清
Owner HITACHI HIGH TECH SCI CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com