Sample rack for measuring critical current properties of high-temperature superconducting tape

A high-temperature superconducting tape and critical current technology, applied in the field of sample racks, can solve problems such as inapplicability and inability to consider the impact, and achieve the effects of ensuring sealing, good sealing, and realizing remote control

Active Publication Date: 2009-06-03
CHINA ELECTRIC POWER RES INST +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional four-lead method is not applicable because it cannot consider the influence of these factors

Method used

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  • Sample rack for measuring critical current properties of high-temperature superconducting tape
  • Sample rack for measuring critical current properties of high-temperature superconducting tape
  • Sample rack for measuring critical current properties of high-temperature superconducting tape

Examples

Experimental program
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Embodiment Construction

[0025] Such as Figure 5 As shown, the device applying the method of the present invention comprises a superconducting tape sample holder 1, a Hall magnetic field probe 2, a temperature probe 3, a background magnetic field magnet 4, a rotating rod 5, a rotating handle 6, a superconducting tape current lead 7, a background Magnetic field magnet current leads 8, low temperature Dewar 9, cooling medium storage container 10, low temperature cooling medium 11, exhaust valve 12, vaporizer 13, vacuum unit 14, GM refrigerator 15, back field magnet DC power supply 16, superconducting DC power supply 17. System control, data acquisition and processing system 18. Among them, the cooling medium storage container, exhaust valve, vaporizer, vacuum unit, GM refrigerator, DC power supply, system control, data acquisition and processing system are placed at room temperature. Superconducting tape sample holder, Hall magnetic field probe, temperature probe, background magnetic field magnet, rot...

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PUM

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Abstract

The invention provides a sample rack for measuring critical current properties of a high-temperature superconducting tape. The sample rack vertically penetrates air gap of an iron core, the upper part thereof is connected to the outside of a low-temperature dewar cover through a rotary rod, and the sample rack controls the rotation angle of a superconducting tape sample through a rotary handle with angle indexes, thereby equivalently realizing the change of the direction of a background magnetic field by changing the rotation angle of the superconducting tape; the sample rack is further connected with a rotatable connecting rod, one end of the connecting rod is connected with the sample rack of the superconducting tape in a dewar, the other end is extended out of the dewar flange cover and connected with the rotary handle with the angle scales, and the rotation of the superconducting tape is realized through the rotation of the rotary handle. The sample rack can simply and rapidly calculate the temperature, the background magnetic field and the impact factors on the change of the direction of the magnetic field thereof, thereby being applicable to the measurement of the critical current properties of YBCO high-temperature superconducting tape.

Description

technical field [0001] The invention relates to a testing device for the critical current characteristic of the second generation high-temperature superconducting strip, in particular to a sample holder in the measuring device for the critical current characteristic of the YBCO superconducting strip in different temperature ranges and under different background magnetic fields and magnetic field directions. Background technique [0002] In 1991, Fujikura of Japan used ion beam assisted deposition (IBAD) to obtain a layer of highly textured yttrium-stabilized zirconia ( YSZ) film, and then pulsed laser deposition (PLD) process was used to epitaxially deposit yttrium oxide YBCO on the baseband coating, announcing the advent of the second generation of high-temperature superconducting tape. Subsequently, the Los Alamos Laboratory (LANL) in the United States optimized these processes and announced in 1995 that the superconducting critical current density at 77K temperature reach...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/00G01R31/00
Inventor 诸嘉慧魏斌丘明
Owner CHINA ELECTRIC POWER RES INST
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