Spectral responsivity test method for plane array detector

A technology of area array detector and spectral response, which is applied in the direction of testing optical performance, etc., to achieve the effects of improving efficiency, saving costs, and sharing resources

Active Publication Date: 2013-11-13
CHINA NORTH IND NO 205 RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, there is no relevant report on the test method of the spectral responsivity of all photosensitive elements on the entire photosensitive surface of the area array detector, that is, the test of the bulk spectral responsivity.

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  • Spectral responsivity test method for plane array detector
  • Spectral responsivity test method for plane array detector
  • Spectral responsivity test method for plane array detector

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Embodiment Construction

[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0027] In order to realize the test of the spectral responsivity of the area array detector, the general idea of ​​the present invention is to propose a method for testing the spectral responsivity of the area array detector on the basis of the existing unit detector spectral responsivity testing device. It combines the spectral responsivity test of the central photosensitive unit of the area array detector with the test of the spatial uniformity of the entire photosensitive surface of the area array detector, so as to realize the test of the full-band spectral responsivity of the area array detector on the entire photosensitive surface.

[0028] according to figure 2 As shown, the unit detector spectral responsivity test device includes a standard integrating sphere light source 1, an input optical system 2, a spectroscopic system 3 ...

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Abstract

The invention discloses a spectral responsivity test method for a plane array detector, which belongs to the field of optical test and metering. The method is characterized in that on the basis of the spectral responsivity test method for a unit detector, the spectral responsivity of an image element in the center of the plane array detector is tested, the measurement of the space uniformity of the plane array detector is combined, and the accurate measurement on the full-wave-band spectral responsivity of the plane array detector in the whole photosensitive surface is realized. The test method solves the difficult problem of the spectral responsivity measurement of the plane array detector, the blank of the spectral responsivity measurement field of the plane array detector is filled, and in addition, the method has the characteristics that the resources are shared, the cost is saved, and the measuring efficiency is high.

Description

technical field [0001] The invention belongs to the field of optical metrology and testing, and mainly relates to a test method for the spectral responsivity of a detector, in particular to a test method for the spectral responsivity of an area array detector. Background technique [0002] Photodetectors play an important role in modern optical technology and optical engineering. Photoelectric detectors are widely used in communications, meteorological satellites, industrial control, scientific research and production, and military industry. The military applications of photoelectric detectors mainly include ultraviolet monitoring and guidance, infrared imaging and guidance, military remote sensing, star trackers, shooting range measurement applications, etc. [0003] In recent years, photodetectors have developed from unit detectors to multi-element array detectors, especially area array detectors. Compared with traditional unit detectors, photodetectors have high sensitiv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 李燕占春连李正琪卢飞陈超王艳
Owner CHINA NORTH IND NO 205 RES INST
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