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Lifetime Prediction Method of Organic Electroluminescent Devices Based on Acceleration Parameters

A technology to accelerate parameters and life prediction, applied in the direction of instruments, electrical digital data processing, special data processing applications, etc., to achieve the effect of reducing life test cost and shortening life test cycle

Inactive Publication Date: 2016-01-20
SHANGHAI UNIVERSITY OF ELECTRIC POWER
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  • Abstract
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Problems solved by technology

[0003] The present invention aims at the problem that the prediction technology of organic electroluminescent devices is backward, and proposes a method for predicting the lifetime of organic electroluminescent devices based on acceleration parameters. Under the conditions that have been determined, if the life expectancy is predicted, only a set of current stress is required The accelerated life test to predict its average life, it is recommended that the current value is close to the highest current stress

Method used

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  • Lifetime Prediction Method of Organic Electroluminescent Devices Based on Acceleration Parameters
  • Lifetime Prediction Method of Organic Electroluminescent Devices Based on Acceleration Parameters
  • Lifetime Prediction Method of Organic Electroluminescent Devices Based on Acceleration Parameters

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Embodiment Construction

[0012] Known Acceleration Parameters The specific implementation steps for predicting OLED life based on the maximum likelihood method are as follows:

[0013] 1. Determination of test data:

[0014] If there is an automatic recording failure device for the failure time of the test sample, it shall be calculated based on the time recorded automatically. If the timing method is used to test, if a certain test interval The number of failures measured in , then the first the first test interval product expiration time should be determined respectively as:

[0015] (1) where: for two adjacent test moments.

[0016] In addition, failures caused by non-product reasons (such as equipment reasons, human reasons, accidents, etc.) during the test should not be included in the number of failures.

[0017] Arrange the failure time from small to large to get a set of test data .

[0018] It should be noted that: what is carried out here is a complete life test, that is...

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Abstract

The invention relates to a method for predicting service life of organic electroluminescent device based on acceleration parameter. Under the condition that organic light emitting diode (OLED) acceleration parameter has been determined, only an acceleration life test of current stress is made, service life of the OLED is described with a logarithmic normal distribution, logarithmic normal distribution parameter is estimated with a maximum likelihood method, average life of the OLED is predicted by introducing formula, and current value is advised to be close to highest current stress. This method can make up the blank of quickly predicting service life of the OLED in our nation, shorten life test cycle, reduce life test cost and provide technical reference for OLED technician to design products according to life index.

Description

technical field [0001] The invention relates to a life testing technology, in particular to a method for predicting the life of an organic electroluminescent device based on accelerated parameters. Background technique [0002] Organic electroluminescent device (OLED for short) is a new generation of flat panel display technology emerging from liquid crystal display technology (LCD), light emitting diode (LED) and plasma display technology (PDP). It has a wide viewing angle, fast response and active light without backlight. source and so on. OLED technology has an extremely broad market prospect and is expected to become the mainstream technology of flat panel display in the future. The lifespan of OLED has been significantly improved in recent years, and the conventional lifespan test can no longer meet the needs of enterprises to quickly predict lifespan. Contents of the invention [0003] The present invention aims at the problem that the prediction technology of orga...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 张建平
Owner SHANGHAI UNIVERSITY OF ELECTRIC POWER
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