Embedded boundary-scan data compression and synthesis method and device

Abstract

The invention discloses an embedded boundary scan data compression and synthesis method and device. The method comprises the steps of: obtaining a standard scan chain data; obtaining a pin data used in the test, a test matrix and a response matrix; storing the standard scan chain data, the pin data used in the test, the test matrix and the response matrix into the chip of the embedded test device; obtaining the standard scan chain data, the pin data used in the test, the test matrix and the response matrix stored in the chip; calculating the position of the scan unit on the standard scan chain data of each pin used in the test to use the vector synthesis standard scan chain data in the test matrix and the vector synthesis standard scan chain data in the response matrix. The method and device effectively solves the problems of small storage space and being unable to conduct the boundary scan test of a large quantity of data of the test device. The data quantity of the boundary scan datum is effectively compressed, storage space is saved, test time and cost are reduced, and production efficiency is increased.

Description

technical field [0001] The invention relates to the technical field of boundary scan testing, in particular to an embedded boundary scan data compression and synthesis method and device. Background technique [0002] Boundary scan technology is the mainstream design-for-test technology for fault detection and diagnosis of complex circuit boards. In the prior art, the boundary-scan test system based on the boundary-scan technology can complete tasks such as test generation, test vector loading, test response analysis, fault display and auxiliary functions. [0003] Embedded boundary-scan technology is a combination of boundary-scan test technology and embedded test technology, and its purpose is to solve heavy testing and diagnosis problems. In the embedded boundary scan technology, the performance of the external boundary scan engine is designed into the test device to enhance test automation, improve test coverage and test efficiency, and reduce test maintenance costs thro...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to compress and synthesize the embedded boundary scan data, so as to solve the problem that the embedded boundary scan test device in the prior art has a small storage space and cannot perform boundary scan tests with a large amount of data

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