Correcting method of residual capacity of BMS battery

Abstract

The invention discloses a correcting method of the residual capacity of a BMS battery. The method comprises the following steps: (1) initializing electrification; (2) recalibrating currents, when a battery management system completes the conventional calibration of a separate passage, obtaining the present current value, and using the present current value as a reference current to recalibrate the current; (3) when different working current sections are given, through a supervisory computer, obtaining an error component value of different current component sections, and according to the error component value, obtaining an error value for calibrating and correcting; (4) when different working temperature sections are given, through the supervisory computer, obtaining the error component value of different temperature component sections, and according to the error component value, obtaining the error value for calibrating and correcting. According to the correcting method provided by the invention, in a production process of the battery management system, working simulation data is provided for the system, so that the electric quantity metering error composition can be analyzed deeply, and through the change of the follow current and the temperature, the integral calculus of the currents is regulated in a self-adapting manner, so that the SOC calculation accuracy can be greatly improved.

Description

technical field [0001] The invention relates to a method for correcting the remaining capacity of a BMS battery. Background technique [0002] Calculating the remaining capacity of the battery management system (BMS) is one of the most basic and important functions of the management system. Generally, the following schemes are adopted: 1. Use the AD and timer integrated on the main chip to send signals to the current sensor on the time abscissa Sampling at intervals, and recording the data after power failure in the memory, and performing cumulative addition / subtraction calculations at the same time, and then calculating SOC according to the rated capacity; The main chip is programmed to read the accumulated value, and calculate the SOC according to the rated capacity. [0003] Among them, in the first scheme, since the timers on the chip are all at the millisecond level, if the charge / discharge current fluctuates greatly, this method will not be able to monitor the data ot...

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Problems solved by technology

[0003] Among them, in the first scheme, because the timers on the chip are all at the millisecond level, if the charge / discharge current fluctuates greatly, then this method will not be able to monitor the data other than the sampling point; in the second scheme, since the dedicated chip itself has The crystal oscillator clock, the sampling frequency can reach MHZ or more, but the power metering chip is designed with a fixed voltage on the voltage channel, and the chip itself will leak a small current into the channel, which will cause the channel to generate superimposed harmonics, and There will be additional errors, and the sampling accuracy of the chip itself will be affected by temperature, and the errors will be greater in the long run

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