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Method of determining short circuit of negative and positive electrodes of organic light-emitting diode

A light-emitting diode, cathode and anode technology, applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problems of complicated process, uncertain position of short-circuited foreign objects, and low detection efficiency

Inactive Publication Date: 2016-10-05
EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, the above-mentioned dark spot defect analysis technology needs to remove the cover glass, the process is complicated, and because the position of the foreign matter that causes the short circuit cannot be determined, it cannot ensure that the foreign matter position can be cut by using the FIB profile analysis technology, so that the detection efficiency is very high. Low

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  • Method of determining short circuit of negative and positive electrodes of organic light-emitting diode
  • Method of determining short circuit of negative and positive electrodes of organic light-emitting diode
  • Method of determining short circuit of negative and positive electrodes of organic light-emitting diode

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Embodiment Construction

[0018] Specific embodiments of the present application will be described in detail below. It should be noted that the embodiments described here are for illustration only, and are not intended to limit the present application.

[0019] The present application will now be described more fully hereinafter with reference to the accompanying drawings, in which example embodiments of the application are shown. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the application to those of ordinary skill in the art.

[0020] The idea of ​​the present application is to use laser to slice the foreign matter existing on the OLED wafer, and then determine whether the foreign matter is a factor causing dark spots according to the brightness state change of the sub-pixel ...

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Abstract

The present application discloses a method for judging the short circuit between cathode and anode of an organic light emitting diode. The method includes: detecting whether there is a foreign object in a sub-pixel unit of the organic light emitting diode; disconnecting the connection between the foreign object and the sub-pixel unit when detecting the presence of a foreign object in the sub-pixel unit; and judging The brightness state of the sub-pixel unit is changed to determine whether the foreign matter causes a short circuit between the cathode and the anode of the sub-pixel unit. The application can improve efficiency, save cost, and has simple operation and high analysis accuracy / success rate.

Description

technical field [0001] The present application relates to an organic light emitting diode chip, in particular to a method for determining the short circuit between cathode and anode of an organic light emitting diode. Background technique [0002] OLED stands for Organic Light-Emitting Diode (Organic Light-Emitting Diode), also known as Organic Electroluminescence Display (OELD). OLED has the characteristic of self-illumination. It uses a very thin organic material coating and glass substrate. When the current passes through, the organic material will emit light. Moreover, the OLED display screen has a large viewing angle and can significantly save power because the OLED screen is It has many incomparable advantages of LCD. [0003] Generally, the pixel unit of an organic light emitting diode is usually composed of three sub-pixel units of red, green and blue (R-G-B) as the smallest image unit, and the structure of each sub-pixel unit generally includes a substrate 1, an T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/02
Inventor 胡友元黄俊杰黄家琦颜圣佑
Owner EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD
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