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Method and system for generating difference circuits and parameterization units thereof

A parametric unit and differential circuit technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as low efficiency of analog circuit design

Active Publication Date: 2017-01-18
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the above technical problems, an embodiment of the present invention provides a method and system for generating parameterized units of differential circuits, as well as a method and system for generating differential circuits, so as to overcome the defect of low efficiency in analog circuit design in the prior art , to improve the generation efficiency of the differential circuit

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  • Method and system for generating difference circuits and parameterization units thereof
  • Method and system for generating difference circuits and parameterization units thereof
  • Method and system for generating difference circuits and parameterization units thereof

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Embodiment Construction

[0080] As mentioned in the background technology section, in the prior art, when generating the schematic diagram and layout of the differential circuit, manual drawing is used, and in the process of generating the schematic diagram and layout of the differential circuit, multiple checks and modifications are required , and the modification of each layer is manually modified, which seriously reduces the generation efficiency of the differential circuit.

[0081] In view of this, an embodiment of the present invention provides a method for generating a differential circuit parameterization unit, including:

[0082] Step 1: Select a differential circuit sample, and obtain preset parameter values ​​of the differential circuit sample. The preset parameters include: the number of MOS transistors in the differential circuit sample, the length of the MOS transistor, the width of the MOS transistor, and the the number of gate folds;

[0083] Step 2: Calculate the width of each gate i...

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Abstract

One embodiment of the invention discloses a method and system for generating difference circuit parameterization units. Difference circuit schematic diagrams and layouts can be generated according to preset parameter values in a selected difference circuit sample and stored correspondingly to generate the difference circuit parameterization units so that the difference circuit parameterization units can be called directly according to the preset parameter values of the difference circuit to be formed in the later specific application to generate the schematic diagrams and layouts of the difference circuit to be formed. Thereby the problem that the generation efficiency is low due to the manual drawing and modifying the schematic and the layouts of the difference circuit in the prior art is solved, and the generation efficiency of the differential circuit is remarkably improved.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to the field of integrated circuit design automation, in particular to a method and system for generating a parameterized unit of a differential circuit, and a method and system for generating a differential circuit. Background technique [0002] The differential circuit is a relatively common circuit structure in analog circuits, and the differential circuit structure is used in the input stages of analog circuits such as operational amplifiers and comparators. Such as figure 1 As shown, the generation method of the differential circuit in the prior art includes: S01: design the size of each device in the differential circuit by the circuit designer, and draw the schematic diagram of the differential circuit; S02: perform circuit function simulation by relying on the schematic diagram of the differential circuit, Determine the size of each device in the differential circui...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 尹明会陈岚赵浙业
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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