A radio frequency two-way eight-channel module mtrx

Abstract

The present invention discloses a radio frequency bidirectional eight-channel module MTRX. The radio frequency bidirectional eight-channel module MTRX comprises two one-to-two chip switches and multiple one-to-four chip switches that are disposed on a printed circuit board (PCB). One one-to-two chip switch receives a signal of an input port TXI of the PCB, and then inputs the signal into two one-to-four chip switches, and each one-to-four chip switch outputs four identical signals from corresponding dual-purpose ports of the PCB finally; and the signals input from all dual-purpose ports are converged finally by two one-to-four chip switches, then are input into another one-to-two chip switch, and are output from an output port LPBK of the PCB. In the radio frequency bidirectional eight-channel module MTRX, multiple chip switches form a bidirectional transceiver module; due to the multi-port design, the bidirectional transceiver module is used as both a signal transmit end and a signal receive end, so that the performance is improved, further, the occupied space is also reduced; and flexible use schemes are provided, so that the use efficiency is improved, and the practicability is high.

Description

technical field [0001] The invention belongs to the technical field of radio frequency signal modules, in particular to a radio frequency bidirectional eight-channel module MTRX. Background technique [0002] At present, in the field of semiconductor testing, test equipment requires more and more types of switches. Mechanical switches are common in equipment. Although mechanical switches meet the testing requirements, their shortcomings of slow switching speed and short switching life greatly limit the efficiency of testing. . [0003] In the field of radio frequency testing, as the device under test has more pins, the demand for signal receiving ports is greater, and the test time of general equipment also increases accordingly. Therefore, although many test systems now use multi-port methods to process signals, they cannot keep up. Increasing testing requirements. Contents of the invention [0004] Purpose of the invention: Aiming at the deficiencies in the prior art, ...

AI Technical Summary

Problems solved by technology

[0002] At present, in the field of semiconductor testing, test equipment requires more and more types of switches. Mechanical switches are common in equipment. Although mechanical switches meet the testing requirements, their shortcomings of slow switching speed and short switching life greatly limit the efficiency of testing.

[0003] In the field of radio frequency testing, as the device under test has more pins, the demand for signal receiving ports is greater, and the test time of general equipment also increases accordingly. Therefore, although many test systems now use multi-port methods to process signals, they cannot keep up. The increasing need for testing

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