The invention is suitable for the technical field of
artificial intelligence, and provides an abnormal
sample image generation method,
electronic equipment and a storage medium, and the method comprises the steps: setting a material parameter
library and a scene parameter
library, and constructing a paired industrial defect sample
data set in combination with three-dimensional geometric models of a plurality of sample workpieces; constructing category text description, defect text description and material category text description of various workpieces, and constructing and training an abnormal
sample image generation model in combination with the paired industrial defect sample
data set; obtaining a target normal image, a candidate defect area
mask image, a target category text description, a target defect text description and a target material category text description of a target category workpiece, and inputting the target normal image, the candidate defect area
mask image, the target category text description, the target defect text description and the target material category text description into an abnormal
sample image generation model for
processing to obtain a target defect image and a target defect area
mask image; the training precision and flexibility of the abnormal sample
image generation model are improved, and then the efficiency and precision of abnormal sample generation are improved.