A method and device for element measurement based on multispectral weighting
A measuring method and technology of measuring device, applied in the field of spectral analysis, can solve the problems of inaccurate analysis results and the like
Active Publication Date: 2018-03-27
HUBEI ENG UNIV
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However, in the existing LIBS, the commonly used quantitative analysis methods are prone to inaccurate analysis results due to spectral line fluctuations or interference from other spectral lines
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[0015] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.
[0016] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...
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Abstract
An embodiment of the invention belongs to the field of spectral analysis and provides a multi-spectral-line weighting based element measurement method and a multi-spectral-line weighting based element measurement device. The method includes: firstly, acquiring the concentration and intensities of at least two target spectral lines and corresponding internal standard spectral lines of a to-be-measured element of each sample in a calibration sample set, and taking an intensity ratio of each target spectral line and the corresponding internal standard spectral line as a relative spectral line intensity of the corresponding target spectral line; secondly, calculating weighted relative spectral line intensity of the to-be-measured element according to a preset weighting coefficient group and the relative spectral line intensity of each target spectral line; thirdly, performing linear fitting according to the concentration of the to-be-measured element in each sample and calculated weighted relative spectral line intensity to determine a calibration curve for measurement of the to-be-measured element. By the calibration method which adopts multiple spectral lines for weighting, analysis inaccuracy caused by spectral line fluctuation resulted from external interferences or plasma fluctuation in single-spectral-line quantitative analysis is avoided, and system analysis accuracy and stability are effectively improved.
Description
technical field [0001] The invention relates to the technical field of spectral analysis, in particular to a method and device for element measurement based on multispectral weighting. Background technique [0002] With the rapid development of economy and technology, in many fields such as mining, metallurgy, environmental protection, chemical industry, energy, cultural relics, jewelry, food safety, biopharmaceuticals, etc., qualitative or quantitative analysis of material components is required. Laser-induced breakdown spectroscopy (LIBS) is a material composition analysis technique based on atomic emission spectroscopy. At the same time, the characteristic spectrum of the elements produced by the radiation during the evolution of the plasma is collected, and the types and contents of the elements in the sample are analyzed. However, in the existing LIBS, the commonly used quantitative analysis methods are prone to inaccurate analysis results due to spectral line fluctuat...
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IPC IPC(8): G01N21/71
CPCG01N21/71
Inventor 曾庆栋余华清童菊芳王波云熊良斌肖永军宣文静张珍云吕昊丁么明
Owner HUBEI ENG UNIV