Multi-classification method based on support vector machine and containing unknown type

A support vector machine and multi-classification technology, applied in multi-classification fields including unknown categories, can solve problems such as rough SVDD model, poor judgment accuracy of new sample data, and poor judgment accuracy, achieving simple algorithm, simple classification model, and complex implementation low degree of effect

Inactive Publication Date: 2017-12-15
INST OF COMPUTING TECH CHINESE ACAD OF SCI
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Problems solved by technology

The main disadvantage of this method exists in the SVDD stage. Since there is only one type of sample data, the trained SVDD model is generally rough. At the same time, it lacks the restrictions and corrections of other types of sample data, and the SVDD model is also prone to overfitting. Therefore, The accuracy of judging whether the new sample data is normal is itself poor, that is, the judgment accuracy of whether the new sample data belongs to an unknown category is poor

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  • Multi-classification method based on support vector machine and containing unknown type
  • Multi-classification method based on support vector machine and containing unknown type
  • Multi-classification method based on support vector machine and containing unknown type

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Embodiment Construction

[0040] The present invention will be described below in conjunction with the accompanying drawings and specific embodiments.

[0041] According to one embodiment of the present invention, a three-class classification method including unknown classes is provided. The three-classification method can be decomposed into three two-classification methods, and each two-classification method includes two stages of training and prediction.

[0042] (1) Training stage:

[0043] Step 1), select one of the categories as the positive category, and the other two categories as the anti-category.

[0044] Step 2), the sample data Mapping from the original space to the new feature space, the sample data The corresponding point in the new feature space is like figure 2 and image 3 Indicated by ▲, ■ and ●. Feature space mapping is a data preprocessing method generally adopted in the SVM classification algorithm. Its purpose is to make the sample data easier to separate in the new fea...

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Abstract

The invention provides a multi-classification method based on a support vector machine and containing unknown types; the method comprises the following steps: 1, identifying whether a to-be-identified sample belongs to the i th type or not respectively according to each trained i th type classifier, wherein the i th type classifier is a binary-class classifier obtained by the following steps: using known samples belonging to the i type to build a positive sample set, using known samples belonging to residual N-1 type to build a negative sample set, using a SVM model to train so as to obtain the i type classifier used for identifying whether the inputted sample belongs to the i type or not; 2, inputting the to-be-identified sample in step1 into each binary-class classifier, if all results are negative, the to-be-identified sample is determined to be an unknown type; in step 1, if only one binary-class classifier output result is positive, the to-be-identified sample is then determined to belong to the type matched with the binary-class classifier. The method can detect unknown types, and is high in recall ratio and precision.

Description

technical field [0001] The invention relates to the field of machine learning, in particular, the invention relates to a support vector machine-based multi-classification method containing unknown categories. Background technique [0002] As a typical machine learning algorithm, support vector machine (SVM) has been widely used in various classification problems due to its complete theoretical support. SVM assumes sample data The original space is generally not linearly separable, and the sample data can be mapped from the original space to a new feature space (the new feature space is generally higher-dimensional), and the sample data The corresponding point in the new feature space is The goal of the binary classification SVM can be described as finding a linear hyperplane in the feature space using the sample data in Is the normal vector of the linear hyperplane, b is the offset, if f(x i )>0 then y i =+1 means that the sample data belongs to the positive ca...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G06K9/62
CPCG06F18/213G06F18/2411G06F18/214
Inventor邢云冰陈益强忽丽莎
OwnerINST OF COMPUTING TECH CHINESE ACAD OF SCI