Rapid inclination phase error compensation method and apparatus based on wavefront rotation

A tilt phase and error compensation technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as being susceptible to noise, limited accuracy, and inability to eliminate off-axis structural tilt errors, etc., to achieve fast and accurate tilt phase The effect of error compensation
CN107677201AActive Publication Date: 2018-02-09SHENZHEN UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHENZHEN UNIV
Publication Date
2018-02-09

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Abstract

The invention is suitable for the optical imaging correction technology field and provides a rapid inclination phase error compensation method and an apparatus based on wavefront rotation. The methodcomprises the following steps of using coaxial digital holographic microscopic system to collect a hologram of an object to be tested and taking as an original hologram; rotating the original hologramfor 180 degrees clockwise or counterclockwise and acquiring a digital reference hologram which is taken as a rotation hologram; using a Fourier transform method in digital holographic microscopy to carry out phase recovery processing on the original hologram, and acquiring an original expansion phase diagram; using the Fourier transform method in the digital holographic microscopy to carry out phase recovery processing on the rotation hologram and acquiring a rotation expansion phase diagram; and subtracting the original expansion phase diagram from the rotation expansion phase diagram and acquiring a phase diagram after compensation for the original expansion phase diagram. By using the method of the invention, rapid and accurate inclination phase error compensation in coaxial digital holographic microscopy imaging is realized.
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Description

technical field

[0001] The invention belongs to the technical field of optical imaging correction, in particular to a fast tilt phase error compensation method and device based on wavefront rotation. Background technique

[0002] As a quantitative phase measurement technology, digital holographic microscopy can obtain quantitative amplitude information and phase information of the object to be measured with only a single hologram, and has the advantages of non-contact, label-free, high resolution, and low cost. Among them, the coaxial digital holographic microstructure is often used in the quantitative measurement of cells and micro-optical components because of its high time stability and compact characteristics. The characteristic of the coaxial digital holographic microscope system is that the optical path of the object light and the optical path of the reference light go through the same optical path, so this structure can not only maintain the stability of the system, b...

Claims

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