A wavelength conversion film for arc detector and arc detector
A wavelength conversion and detector technology, applied in the field of X-ray diffraction detection, can solve the problems of slow detection speed, high maintenance cost, poor comparability of intensity information, etc., to achieve real-time detection, improved conversion efficiency, and strong adaptability.
Active Publication Date: 2019-09-27
NANJING CENT CHINA GEOLOGICAL SURVEY
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Problems solved by technology
Usually, it takes about 10 minutes to analyze the phase of the diffraction pattern with a 2θ of 50°. This detection method is not only slow in detection speed, but also unable to perform in-situ analysis and capture changes in material structure in real time. Time-varying, the original intensity of the light source changes during the detector rotation, and the intensity information at different diffraction positions is not comparable
A small number of X-ray diffraction analysis systems use two-dimensional plane detection technology, such as IP boards, and high-resolution two-dimensional detectors (IP boards) that can receive X-ray diffraction lines are mainly expensive, high maintenance costs, and the diffraction information is not in the same Diffraction On the diffraction circle, the diffraction intensity needs to be converted, which affects the use of this detection method, so IP boards are mostly used in medical imaging with low resolution requirements
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[0036] This embodiment provides a wavelength conversion film for arc detectors, such as Figure 10 with Figure 11 As shown, the wavelength conversion film 9 includes a metal frame 91, a scintillator packaging substrate 92, a metal beryllium covering layer 93, and more than two scintillator units 94;
[0037] The scintillator packaging base (92) is fixedly installed on the metal outer frame 91, the scintillator units (94) are distributed in the scintillator packaging base 92, the metal beryllium covering layer 93 covers the upper surface of the scintillator packaging base 92, and is welded fixed on the metal frame 91;
[0038] Figure 9 It is a partial cross-sectional view of the upper surface of the scintillator packaging substrate, wherein 94 is a scintillator unit, and 92 is a scintillator packaging substrate. Figure 10 It is a partial view of the wavelength conversion film, wherein 93 is a metal beryllium covering layer, and 91 is a metal outer frame. Figure 11 It is...
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Abstract
The invention discloses a wavelength conversion film for an arc-shaped detector and the arc-shaped detector. The arc-shaped detector comprises the wavelength conversion film, a fixed cover, a signal input port, an optical fiber beam, a signal output port and a signal receiving port, wherein the left side of the signal input port is provided with a concave circular arc surface; the concave circulararc surface is matched with a diffraction circle which is diffracted by X-rays; the wavelength conversion film is arranged on the concave circular arc surface through the fixed cover, the concave circular arc surface is provided with a through precision slit, the optical fiber beam is orderly arranged in the precision slit according to the preset rule, and the end surface of the incident end surface of each optical fiber of the optical fiber beam is in non-distance coupling with the wavelength conversion film, and is sequentially and fixedly arranged on the extension lien of the radius direction of the diffraction circle. The arc-shaped detector has the advantages that the size is small, and the weight is light; the conventional rotary parts are not arranged, so that the maintenance is not required, and the cost is reduced; by adopting the non-scanning type in working, the speed is quick, and the real-time detection of an X-ray diffraction atlas is realized.
Description
technical field [0001] The invention belongs to the technical field of X-ray diffraction detection, and in particular relates to a wavelength conversion film used for an arc detector and the arc detector. Background technique [0002] X-ray diffraction analysis (X-ray diffraction, referred to as XRD) is a structural analysis method for the size and spatial distribution of atoms that make up crystalline substances by using X-ray diffraction of scintillators. Specifically, when x-rays of a specific wavelength are irradiated on a crystalline material, the x-rays encounter a lattice structure composed of regularly arranged atoms in the scintillator and diffract, thus displaying a diffraction phenomenon corresponding to the crystal structure. Most of the X-ray diffraction wavelength conversion films used in the prior art are only covered with a layer of scintillator coating on the receiving surface of the detector. The structure is simple and the conversion efficiency is very low...
Claims
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IPC IPC(8): G01N23/20008G01N23/207
Inventor黄俊杰杨彬殷靓
OwnerNANJING CENT CHINA GEOLOGICAL SURVEY