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A multi-state system reliability evaluation method considering state transition correlation

A multi-state system and state transition technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of ignoring the correlation between system state transitions, failing to analyze and evaluate system reliability, and achieving various forms , the effect of improving accuracy

Inactive Publication Date: 2019-01-18
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

Under the above circumstances, if the correlation between system state transitions is still ignored, it will not be possible to conduct accurate reliability analysis and evaluation of the system

Method used

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  • A multi-state system reliability evaluation method considering state transition correlation
  • A multi-state system reliability evaluation method considering state transition correlation
  • A multi-state system reliability evaluation method considering state transition correlation

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Embodiment Construction

[0029] In order to facilitate those skilled in the art to understand the technical content of the present invention, the content of the present invention will be further explained below in conjunction with the accompanying drawings.

[0030] Such as figure 1 As shown, a multi-state system reliability evaluation method considering the state transition correlation of the present invention, assuming that the marginal distribution function type describing the failure law of the system in each state and the copula function type describing the correlation are known, it can be established Candidate models for describing the system state degradation process. According to the state observation data of the system, the model selection method in the present invention is used to select the most suitable system reliability model, and then the state distribution and reliability of the system can be calculated; in addition, the observation data collected by the system during operation The up...

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Abstract

The invention discloses a multi-state system reliability evaluation method considering state transition correlation. The complex correlations between state transitions are described by copula function, and the unknown parameters in the model are estimated by the state observation data of the system. The best model is selected by using Bayesian information criterion. On this basis, the reliabilityand conditional reliability of the system are calculated. Since the method of the invention uses a copula function to model the correlation between system state transitions, the failure law of the system in each state is different and the correlation forms between the state transitions are various. Compared with the prior method, the present invention can realize the reliability modeling of the multi-state system with complex failure law, thereby improving the accuracy of the system reliability evaluation.

Description

technical field [0001] The invention belongs to the field of complex system reliability, in particular to a multi-state system reliability evaluation technology. Background technique [0002] The traditional two-state reliability theory holds that the system has only two states: normal operation and complete failure. However, with the gradual expansion of the application field of reliability theory and the in-depth exploration of the failure mechanism and potential laws of the system, it is found that the complex system and its component units show multi-state characteristics of gradual degradation of state and gradual change of performance during the service stage. In addition to normal operation and complete failure, systems and components also have multiple intermediate states, and the failure laws and mechanisms, work performance and efficiency of each state are different. In this case, the conventional two-state reliability theory cannot accurately describe the complex...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 刘宇刘钦榛黎书瑞
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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